An aberration corrected photoemission electron microscope at the advanced light source

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Design of a new aberration corrected Photoemission electron microscope PEEM3 at the Advanced Light Source is outlined. PEEM3 will be installed on an elliptically polarized undulator beamline and will be used for the study of complex materials at high spatial and spectral resolution. The critical components of PEEM3 are the electron mirror aberration corrector and aberration-free magnetic beam separator. The models to calculate the optical properties of the electron mirror are discussed. The goal of the PEEM3 project is to achieve the highest possible transmission of the system at resolutions comparable to our present PEEM2 system (50 nm) and to ... continued below

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4 pages

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Feng, J.; MacDowell, A.A.; Duarte, R.; Doran, A.; Forest, E.; Kelez, N. et al. November 1, 2003.

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Description

Design of a new aberration corrected Photoemission electron microscope PEEM3 at the Advanced Light Source is outlined. PEEM3 will be installed on an elliptically polarized undulator beamline and will be used for the study of complex materials at high spatial and spectral resolution. The critical components of PEEM3 are the electron mirror aberration corrector and aberration-free magnetic beam separator. The models to calculate the optical properties of the electron mirror are discussed. The goal of the PEEM3 project is to achieve the highest possible transmission of the system at resolutions comparable to our present PEEM2 system (50 nm) and to enable significantly higher resolution, albeit at the sacrifice of intensity. We have left open the possibility to add an energy filter at a later date, if it becomes necessary driven by scientific need to improve the resolution further.

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4 pages

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INIS; OSTI as DE00827085

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  • Eighth International Conference on Synchrotron Radiation Instrumentation, San Francisco, CA (US), 08/25/2003--08/29/2003

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  • Report No.: LBNL--53195
  • Grant Number: AC03-76SF00098
  • Office of Scientific & Technical Information Report Number: 827085
  • Archival Resource Key: ark:/67531/metadc784878

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  • November 1, 2003

Added to The UNT Digital Library

  • Dec. 3, 2015, 9:30 a.m.

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  • Sept. 21, 2017, 6:01 p.m.

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Feng, J.; MacDowell, A.A.; Duarte, R.; Doran, A.; Forest, E.; Kelez, N. et al. An aberration corrected photoemission electron microscope at the advanced light source, article, November 1, 2003; Berkeley, California. (digital.library.unt.edu/ark:/67531/metadc784878/: accessed September 23, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.