Laser modulated scattering as a nondestructive evaluation tool for optical surfaces and thin film coatings

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Laser modulated scattering (LMS) is introduced as a non-destructive evaluation tool for defect inspection and characterization of optical surfaces and thin film coatings. This technique is a scatter sensitive version of the well-known photothermal microscopy (PTM) technique. It allows simultaneous measurement of the DC and AC scattering signals of a probe laser beam from an optical surface. By comparison between the DC and AC scattering signals, one can differentiate absorptive defects from non-absorptive ones. This paper describes the principle of the LMS technique and the experimental setup, and illustrates examples on using LMS as a tool for nondestructive evaluation of ... continued below

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Feit, M D; Kozlowski, M R; Rubenchik, A M; Sheehan, L & Wu, Z L December 22, 1999.

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Description

Laser modulated scattering (LMS) is introduced as a non-destructive evaluation tool for defect inspection and characterization of optical surfaces and thin film coatings. This technique is a scatter sensitive version of the well-known photothermal microscopy (PTM) technique. It allows simultaneous measurement of the DC and AC scattering signals of a probe laser beam from an optical surface. By comparison between the DC and AC scattering signals, one can differentiate absorptive defects from non-absorptive ones. This paper describes the principle of the LMS technique and the experimental setup, and illustrates examples on using LMS as a tool for nondestructive evaluation of high quality optics.

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876 Kilobytes

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  • 30th Boulder Damage Symposium: Annual Symposium on Optical Materials for High Power Lasers, Boulder, CO, September 28-October 1, 1998

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  • Other: DE00008355
  • Report No.: UCRL-JC-131211
  • Grant Number: W-7405-Eng-48
  • Office of Scientific & Technical Information Report Number: 8355
  • Archival Resource Key: ark:/67531/metadc782172

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  • December 22, 1999

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  • Dec. 3, 2015, 9:30 a.m.

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  • May 6, 2016, 10:51 p.m.

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Feit, M D; Kozlowski, M R; Rubenchik, A M; Sheehan, L & Wu, Z L. Laser modulated scattering as a nondestructive evaluation tool for optical surfaces and thin film coatings, article, December 22, 1999; Livermore, California. (digital.library.unt.edu/ark:/67531/metadc782172/: accessed November 14, 2018), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.