Tunable coherent radiation at soft X-ray wavelengths: Generation and interferometric applications Metadata

Title

• Main Title Tunable coherent radiation at soft X-ray wavelengths: Generation and interferometric applications

Creator

• Author: Rosfjord, Kristine Marie
  Creator Type: Personal

Contributor

• Sponsor: United States. Department of Energy. Office of Basic Energy Sciences.
  Contributor Type: Organization
  Contributor Info: USDOE Director. Office of Science. Office of Basic Energy Sciences (United States)

Publisher

• Name: Lawrence Berkeley National Laboratory
  Place of Publication: Berkeley, California
  Additional Info: Ernest Orlando Lawrence Berkeley National Laboratory, Berkeley, CA (United States)

Date

• Creation: 2004-07-01

Language

• English

Description

• Content Description: The availability of high power, spectrally and spatially coherent soft x-rays (SXR) would facilitate a wide variety of experiments as this energy region covers the primary resonances of many magnetic and biological materials. Specifically, there are the carbon and oxygen K-edges that are critical for biological imaging in the water window and the L-edges of iron, nickel, and cobalt for which imaging and scattering studies can be performed. A new coherent soft X-ray branchline at the Advanced Light Source has begun operation (beamline 12.0.2). Using the third harmonic from an 8 cm period undulator, this branch delivers coherent soft x-rays with photon energies ranging from 200eV to 1keV. This branchline is composed of two sub-branches one at 14X demagnification and the other 8X demagnification. The former is optimized for use at 500eV and the latter at 800eV. Here the expected power from the third harmonic of this undulator and the beamline design and characterization is presented. The characterization includes measurements on available photon flux as well as a series of double pinhole experiments to determine the coherence factor with respect to transverse distance. The first high quality Airy patterns at SXR wavelengths are created with this new beamline. The operation of this new beamline allows for interferometry to be performed in the SXR region. Here an interferometric experiment designed to directly determine the index of refraction of a material under test is performed. Measurements are first made in the EUV region using an established beamline (beamline12.0.1) to measure silicon, ruthenium and tantalum silicon nitride. This work is then extended to the SXR region using beamline 12.0.2 to test chromium and vanadium.
• Physical Description: 130 pages

Subject

• Keyword: Ruthenium
• Keyword: Biological Materials
• Keyword: Nickel
• Keyword: Silicon Nitrides
• Keyword: Oxygen
• Keyword: Refractive Index
• STI Subject Categories: 43 Particle Accelerators
• STI Subject Categories: 36 Materials Science
• Keyword: Iron
• Keyword: Cobalt
• Keyword: Coherent Radiation
• Keyword: Tantalum
• Keyword: Vanadium
• Keyword: Advanced Light Source
• Keyword: Carbon
• Keyword: Wiggler Magnets
• Keyword: Wavelengths
• Keyword: Chromium
• Keyword: Interferometry

Source

• Other Information: TH: Thesis (Ph.D.); Submitted to Engineering-Electrical Engineering and Computer Sciences, University of California, Berkeley, California (US)

Collection

• Name: Office of Scientific & Technical Information Technical Reports
  Code: OSTI

Institution

• Name: UNT Libraries Government Documents Department
  Code: UNTGD

Resource Type

• Thesis or Dissertation

Format

• Text

Identifier

• Report No.: LBNL--55752
• Grant Number: AC03-76SF00098
• Office of Scientific & Technical Information Report Number: 827582
• Archival Resource Key: ark:/67531/metadc781717

Note

• Display Note: INIS; OSTI as DE00827582