Tunable coherent radiation at soft X-ray wavelengths: Generation and interferometric applications

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The availability of high power, spectrally and spatially coherent soft x-rays (SXR) would facilitate a wide variety of experiments as this energy region covers the primary resonances of many magnetic and biological materials. Specifically, there are the carbon and oxygen K-edges that are critical for biological imaging in the water window and the L-edges of iron, nickel, and cobalt for which imaging and scattering studies can be performed. A new coherent soft X-ray branchline at the Advanced Light Source has begun operation (beamline 12.0.2). Using the third harmonic from an 8 cm period undulator, this branch delivers coherent soft x-rays ... continued below

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130 pages

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Rosfjord, Kristine Marie July 1, 2004.

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Description

The availability of high power, spectrally and spatially coherent soft x-rays (SXR) would facilitate a wide variety of experiments as this energy region covers the primary resonances of many magnetic and biological materials. Specifically, there are the carbon and oxygen K-edges that are critical for biological imaging in the water window and the L-edges of iron, nickel, and cobalt for which imaging and scattering studies can be performed. A new coherent soft X-ray branchline at the Advanced Light Source has begun operation (beamline 12.0.2). Using the third harmonic from an 8 cm period undulator, this branch delivers coherent soft x-rays with photon energies ranging from 200eV to 1keV. This branchline is composed of two sub-branches one at 14X demagnification and the other 8X demagnification. The former is optimized for use at 500eV and the latter at 800eV. Here the expected power from the third harmonic of this undulator and the beamline design and characterization is presented. The characterization includes measurements on available photon flux as well as a series of double pinhole experiments to determine the coherence factor with respect to transverse distance. The first high quality Airy patterns at SXR wavelengths are created with this new beamline. The operation of this new beamline allows for interferometry to be performed in the SXR region. Here an interferometric experiment designed to directly determine the index of refraction of a material under test is performed. Measurements are first made in the EUV region using an established beamline (beamline12.0.1) to measure silicon, ruthenium and tantalum silicon nitride. This work is then extended to the SXR region using beamline 12.0.2 to test chromium and vanadium.

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130 pages

Notes

INIS; OSTI as DE00827582

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  • Other Information: TH: Thesis (Ph.D.); Submitted to Engineering-Electrical Engineering and Computer Sciences, University of California, Berkeley, California (US)

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  • Report No.: LBNL--55752
  • Grant Number: AC03-76SF00098
  • Office of Scientific & Technical Information Report Number: 827582
  • Archival Resource Key: ark:/67531/metadc781717

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  • July 1, 2004

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  • Dec. 3, 2015, 9:30 a.m.

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  • April 4, 2016, 2:40 p.m.

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Rosfjord, Kristine Marie. Tunable coherent radiation at soft X-ray wavelengths: Generation and interferometric applications, thesis or dissertation, July 1, 2004; Berkeley, California. (digital.library.unt.edu/ark:/67531/metadc781717/: accessed August 16, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.