A hard x-ray micro-analytical beamline at the CAMD synchrotron

PDF Version Also Available for Download.

Description

Argonne National Laboratory (ANL) is collaborating with Louisiana State University (LSU) in constructing a synchrotron x-ray micro-analytical beamline at the Center for Advanced Microstructures and Devices (CAMD) in Baton Rouge. This project grew from earlier work at the National Synchrotron Light Source (NSLS), where a team of ANL researchers developed techniques to examine small-scale structures in diffusion zones of a variety of materials. The ANL/CAMD beamline will use x-ray fluorescence, diffraction, and absorption spectroscopy techniques to reveal both compositional and structural information on a microscopic scale.

Physical Description

6 p.

Creation Information

Petri, M. C.; Leibowitz, L. & Schilling, P. July 1995.

Context

This article is part of the collection entitled: Office of Scientific & Technical Information Technical Reports and was provided by UNT Libraries Government Documents Department to Digital Library, a digital repository hosted by the UNT Libraries. It has been viewed 34 times . More information about this article can be viewed below.

Who

People and organizations associated with either the creation of this article or its content.

Authors

Sponsor

Publisher

Provided By

UNT Libraries Government Documents Department

Serving as both a federal and a state depository library, the UNT Libraries Government Documents Department maintains millions of items in a variety of formats. The department is a member of the FDLP Content Partnerships Program and an Affiliated Archive of the National Archives.

Contact Us

What

Descriptive information to help identify this article. Follow the links below to find similar items on the Digital Library.

Description

Argonne National Laboratory (ANL) is collaborating with Louisiana State University (LSU) in constructing a synchrotron x-ray micro-analytical beamline at the Center for Advanced Microstructures and Devices (CAMD) in Baton Rouge. This project grew from earlier work at the National Synchrotron Light Source (NSLS), where a team of ANL researchers developed techniques to examine small-scale structures in diffusion zones of a variety of materials. The ANL/CAMD beamline will use x-ray fluorescence, diffraction, and absorption spectroscopy techniques to reveal both compositional and structural information on a microscopic scale.

Physical Description

6 p.

Notes

OSTI as DE95014232

Source

  • 40. annual meeting of the Society of Photo-Optical Instrumentation Engineers, San Diego, CA (United States), 9-14 Jul 1995

Language

Item Type

Identifier

Unique identifying numbers for this article in the Digital Library or other systems.

  • Other: DE95014232
  • Report No.: ANL/ED/CP--86766
  • Report No.: CONF-950793--2
  • Grant Number: W-31109-ENG-38
  • Office of Scientific & Technical Information Report Number: 82179
  • Archival Resource Key: ark:/67531/metadc780041

Collections

This article is part of the following collection of related materials.

Office of Scientific & Technical Information Technical Reports

Reports, articles and other documents harvested from the Office of Scientific and Technical Information.

Office of Scientific and Technical Information (OSTI) is the Department of Energy (DOE) office that collects, preserves, and disseminates DOE-sponsored research and development (R&D) results that are the outcomes of R&D projects or other funded activities at DOE labs and facilities nationwide and grantees at universities and other institutions.

What responsibilities do I have when using this article?

When

Dates and time periods associated with this article.

Creation Date

  • July 1995

Added to The UNT Digital Library

  • Dec. 3, 2015, 9:30 a.m.

Description Last Updated

  • Dec. 7, 2015, 4:44 p.m.

Usage Statistics

When was this article last used?

Yesterday: 0
Past 30 days: 1
Total Uses: 34

Interact With This Article

Here are some suggestions for what to do next.

Start Reading

PDF Version Also Available for Download.

International Image Interoperability Framework

IIF Logo

We support the IIIF Presentation API

Petri, M. C.; Leibowitz, L. & Schilling, P. A hard x-ray micro-analytical beamline at the CAMD synchrotron, article, July 1995; Illinois. (digital.library.unt.edu/ark:/67531/metadc780041/: accessed September 20, 2018), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.