Development and Applications of Time of Flight Neutron Depth Profiling

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The depth profiles of intentional or intrinsic constituents of a sample provide valuable information for the characterization of materials. For example, the subtle differences in spatial distribution and composition of many chemical species in the near surface region and across interfacial boundaries can significantly alter the electronic and optical properties of materials. A number of analytical techniques for depth profiling have been developed during the last two decades. neutron Depth Profiling (NDP) is one of the leading analytical techniques. The NDP is a nondestructive near surface technique that utilizes thermal/cold neutron beam to measure the concentration of specific light elements ... continued below

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Cady, Bingham & Unlu, Kenan March 17, 2005.

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Description

The depth profiles of intentional or intrinsic constituents of a sample provide valuable information for the characterization of materials. For example, the subtle differences in spatial distribution and composition of many chemical species in the near surface region and across interfacial boundaries can significantly alter the electronic and optical properties of materials. A number of analytical techniques for depth profiling have been developed during the last two decades. neutron Depth Profiling (NDP) is one of the leading analytical techniques. The NDP is a nondestructive near surface technique that utilizes thermal/cold neutron beam to measure the concentration of specific light elements versus their depth in materials. The depth is obtained from the energy loss of protons, alphas or recoil atoms in substrate materials. Since the charged particle energy determination using surface barrier detector is used for NDP, the depth resolution is highly dependent on the detectors an d detection instruments. The depth resolutions of a few tens of nm are achieved with available NDP facilities in the world. However, the performance of NDP needs to be improved in order to obtain a few A depth resolutions.

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INIS; OSTI as DE00838303

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  • Other Information: PBD: 17 Mar 2005

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  • Report No.: DOE/ID/13921
  • Grant Number: FG07-00ID13921
  • DOI: 10.2172/838303 | External Link
  • Office of Scientific & Technical Information Report Number: 838303
  • Archival Resource Key: ark:/67531/metadc780023

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  • March 17, 2005

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  • Dec. 3, 2015, 9:30 a.m.

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  • Jan. 3, 2017, 2:13 p.m.

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Cady, Bingham & Unlu, Kenan. Development and Applications of Time of Flight Neutron Depth Profiling, report, March 17, 2005; United States. (digital.library.unt.edu/ark:/67531/metadc780023/: accessed October 19, 2018), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.