Angle Resolved X-ray Photoelectron Spectroscopy of 2-methyl-4-nitroanaline Thin Films

PDF Version Also Available for Download.

Description

Angle-resolved XPS (ARXPS) was performed on thin films of 2-methyl-4-nitroanaline (MNA) vapor deposited onto a Si(001) substrate. The relative concentrations of the different components observed in the MNA film at takeoff angles of 30 and 90 degrees was determined. This allows an estimation of the layer composition and thickness as well as depth of all layers within a region of several electron escape depths from the surface [1]. The results obtained are compared to layer thicknesses from ellipsometric measurements and atomic force microscopy (AFM).

Physical Description

357 Kilobytes pages

Creation Information

Gillman, Edward S.; Seo, Kang & Wang, Liqun March 1, 2002.

Context

This article is part of the collection entitled: Office of Scientific & Technical Information Technical Reports and was provided by UNT Libraries Government Documents Department to Digital Library, a digital repository hosted by the UNT Libraries. More information about this article can be viewed below.

Who

People and organizations associated with either the creation of this article or its content.

Sponsor

Publisher

Provided By

UNT Libraries Government Documents Department

Serving as both a federal and a state depository library, the UNT Libraries Government Documents Department maintains millions of items in a variety of formats. The department is a member of the FDLP Content Partnerships Program and an Affiliated Archive of the National Archives.

Contact Us

What

Descriptive information to help identify this article. Follow the links below to find similar items on the Digital Library.

Description

Angle-resolved XPS (ARXPS) was performed on thin films of 2-methyl-4-nitroanaline (MNA) vapor deposited onto a Si(001) substrate. The relative concentrations of the different components observed in the MNA film at takeoff angles of 30 and 90 degrees was determined. This allows an estimation of the layer composition and thickness as well as depth of all layers within a region of several electron escape depths from the surface [1]. The results obtained are compared to layer thicknesses from ellipsometric measurements and atomic force microscopy (AFM).

Physical Description

357 Kilobytes pages

Source

  • American Physics Society March Meeting, Indianapolis, IN (US), 03/18/2002--03/22/2002

Language

Item Type

Identifier

Unique identifying numbers for this article in the Digital Library or other systems.

  • Report No.: JLAB-ACC-02-06
  • Report No.: DOE/ER/40150-2041
  • Grant Number: AC05-84ER40150
  • Office of Scientific & Technical Information Report Number: 793121
  • Archival Resource Key: ark:/67531/metadc741445

Collections

This article is part of the following collection of related materials.

Office of Scientific & Technical Information Technical Reports

Reports, articles and other documents harvested from the Office of Scientific and Technical Information.

Office of Scientific and Technical Information (OSTI) is the Department of Energy (DOE) office that collects, preserves, and disseminates DOE-sponsored research and development (R&D) results that are the outcomes of R&D projects or other funded activities at DOE labs and facilities nationwide and grantees at universities and other institutions.

What responsibilities do I have when using this article?

When

Dates and time periods associated with this article.

Creation Date

  • March 1, 2002

Added to The UNT Digital Library

  • Oct. 19, 2015, 7:39 p.m.

Description Last Updated

  • Feb. 5, 2016, 7:50 p.m.

Usage Statistics

When was this article last used?

Yesterday: 0
Past 30 days: 0
Total Uses: 3

Interact With This Article

Here are some suggestions for what to do next.

Enlarge

PDF Version Also Available for Download.

International Image Interoperability Framework

IIF Logo

We support the IIIF Presentation API

Gillman, Edward S.; Seo, Kang & Wang, Liqun. Angle Resolved X-ray Photoelectron Spectroscopy of 2-methyl-4-nitroanaline Thin Films, article, March 1, 2002; Newport News, Virginia. (digital.library.unt.edu/ark:/67531/metadc741445/: accessed September 20, 2018), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.