Quantitative measurements of magnetic vortices using position resolved diffraction in Lorentz STEM

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A number of electron column techniques have been developed over the last forty years to permit visualization of magnetic fields in specimens. These include: Fresnel imaging, Differential Phase Contrast, Electron Holography and Lorentz STEM. In this work we have extended the LSTEM methodology using Position Resolved Diffraction (PRD) to quantitatively measure the in-plane electromagnetic fields of thin film materials. The experimental work reported herein has been carried out using the ANL AAEM HB603Z 300 kV FEG instrument 5. In this instrument, the electron optical column was operated in a zero field mode, at the specimen, where the objective lens is ... continued below

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Zaluzec, N. J. March 5, 2002.

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A number of electron column techniques have been developed over the last forty years to permit visualization of magnetic fields in specimens. These include: Fresnel imaging, Differential Phase Contrast, Electron Holography and Lorentz STEM. In this work we have extended the LSTEM methodology using Position Resolved Diffraction (PRD) to quantitatively measure the in-plane electromagnetic fields of thin film materials. The experimental work reported herein has been carried out using the ANL AAEM HB603Z 300 kV FEG instrument 5. In this instrument, the electron optical column was operated in a zero field mode, at the specimen, where the objective lens is turned off and the probe forming lens functions were reallocated to the C1, C2, and C3 lenses. Post specimen lenses (P1, P2, P3, P4) were used to magnify the transmitted electrons to a YAG screen, which was then optically transferred to a Hamamatsu ORCA ER CCD array. This CCD was interfaced to an EmiSpec Data Acquisition System and the data was subsequently transferred to an external computer system for detailed quantitative analysis. In Position Resolved Diffraction mode, we digitally step a focused electron probe across the region of interest of the specimen while at the same time recording the complete diffraction pattern at each point in the scan.

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  • Microscopy and Microanalysis, Quebec City, Quebec (CA), 08/04/2002--08/08/2002

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  • Report No.: ANL/MSD/CP-107000
  • Grant Number: W-31-109-ENG-38
  • Office of Scientific & Technical Information Report Number: 799830
  • Archival Resource Key: ark:/67531/metadc739707

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Office of Scientific & Technical Information Technical Reports

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  • March 5, 2002

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  • Oct. 19, 2015, 7:39 p.m.

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  • March 23, 2016, 12:33 p.m.

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Zaluzec, N. J. Quantitative measurements of magnetic vortices using position resolved diffraction in Lorentz STEM, article, March 5, 2002; Illinois. (digital.library.unt.edu/ark:/67531/metadc739707/: accessed October 17, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.