Experiences with remote electron microscopy

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With the advent of a rapidly proliferating international computer network, it became feasible to consider remote operation of instrumentation normally operated locally. For modern electron microscopes, the growing automation and computer control of many instrumental operations facilitated the task of providing remote operation. In order to provide use of NCEM TEMs by distant users, a project was instituted in 1995 to place a unique instrument, a Kratos EM-1500 operating at 1.5MeV, on-line for remote use. In 1996, the Materials Microcharacterization Collaboratory (MMC) was created as a pilot project within the US Department of Energy's DOE2000 program to establish national collaboratories ... continued below

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O'Keefe, Michael A. & Parvin, Bahram February 22, 2002.

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With the advent of a rapidly proliferating international computer network, it became feasible to consider remote operation of instrumentation normally operated locally. For modern electron microscopes, the growing automation and computer control of many instrumental operations facilitated the task of providing remote operation. In order to provide use of NCEM TEMs by distant users, a project was instituted in 1995 to place a unique instrument, a Kratos EM-1500 operating at 1.5MeV, on-line for remote use. In 1996, the Materials Microcharacterization Collaboratory (MMC) was created as a pilot project within the US Department of Energy's DOE2000 program to establish national collaboratories to provide access via the Internet to unique or expensive DOE research facilities as well as to expertise for remote collaboration, experimentation, production, software development, modeling, and measurement. A major LBNL contribution to the MMC was construction of DeepView, a microscope-independent computer-control system that could be ported to other MMC members to provide a common graphical user-interface (GUI) for control of any MMC instrument over the wide area network.

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OSTI as DE00793776

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  • The 15th International Congress on Electron Microscopy (ICEM-15), Durban (ZA), 09/01/2002--09/06/2002

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  • Report No.: LBNL--49679
  • Grant Number: AC03-76SF00098
  • Office of Scientific & Technical Information Report Number: 793776
  • Archival Resource Key: ark:/67531/metadc739524

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  • February 22, 2002

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  • Oct. 19, 2015, 7:39 p.m.

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  • April 4, 2016, 6:37 p.m.

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O'Keefe, Michael A. & Parvin, Bahram. Experiences with remote electron microscopy, article, February 22, 2002; California. (digital.library.unt.edu/ark:/67531/metadc739524/: accessed August 20, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.