Extraction of highly charged ions from the electron beam ion trap at LBNL for applications in surface analysis and Materials Science

PDF Version Also Available for Download.

Description

We describe results from highly ion extraction experiments at the Electron Beam Ion Trap (EBIT) facility which is now operated at Lawrence Berkeley National Laboratory after transfer from Lawrence Livermore National Laboratory. Requirements on ion source performance for the application of highly charged ions (e. g. Xe{sup 44+}) in surface analysis and materials science are discussed.

Physical Description

14 pages

Creation Information

Schenkel, T.; Persaud, A.; Kraemer, A.; McDonald, J.W.; Holder, J.P.; Hamza, A.V. et al. September 6, 2001.

Context

This article is part of the collection entitled: Office of Scientific & Technical Information Technical Reports and was provided by UNT Libraries Government Documents Department to Digital Library, a digital repository hosted by the UNT Libraries. More information about this article can be viewed below.

Who

People and organizations associated with either the creation of this article or its content.

Provided By

UNT Libraries Government Documents Department

Serving as both a federal and a state depository library, the UNT Libraries Government Documents Department maintains millions of items in a variety of formats. The department is a member of the FDLP Content Partnerships Program and an Affiliated Archive of the National Archives.

Contact Us

What

Descriptive information to help identify this article. Follow the links below to find similar items on the Digital Library.

Description

We describe results from highly ion extraction experiments at the Electron Beam Ion Trap (EBIT) facility which is now operated at Lawrence Berkeley National Laboratory after transfer from Lawrence Livermore National Laboratory. Requirements on ion source performance for the application of highly charged ions (e. g. Xe{sup 44+}) in surface analysis and materials science are discussed.

Physical Description

14 pages

Notes

INIS; OSTI as DE00815471

Source

  • 9th International Conference on Ion Sources (ICIS'01), Oakland, CA (US), 09/03/2001--09/07/2001

Language

Item Type

Identifier

Unique identifying numbers for this article in the Digital Library or other systems.

  • Report No.: LBNL--47776
  • Grant Number: AC03-76SF00098
  • Office of Scientific & Technical Information Report Number: 815471
  • Archival Resource Key: ark:/67531/metadc738161

Collections

This article is part of the following collection of related materials.

Office of Scientific & Technical Information Technical Reports

What responsibilities do I have when using this article?

When

Dates and time periods associated with this article.

Creation Date

  • September 6, 2001

Added to The UNT Digital Library

  • Oct. 18, 2015, 6:40 p.m.

Description Last Updated

  • April 4, 2016, 12:56 p.m.

Usage Statistics

When was this article last used?

Yesterday: 0
Past 30 days: 0
Total Uses: 4

Interact With This Article

Here are some suggestions for what to do next.

Start Reading

PDF Version Also Available for Download.

Citations, Rights, Re-Use

Schenkel, T.; Persaud, A.; Kraemer, A.; McDonald, J.W.; Holder, J.P.; Hamza, A.V. et al. Extraction of highly charged ions from the electron beam ion trap at LBNL for applications in surface analysis and Materials Science, article, September 6, 2001; Berkeley, California. (digital.library.unt.edu/ark:/67531/metadc738161/: accessed September 20, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.