MICROANALYSIS OF MATERIALS USING SYNCHROTRON RADIATION.

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Description

High intensity synchrotron radiation produces photons with wavelengths that extend from the infrared to hard x rays with energies of hundreds of keV with uniquely high photon intensities that can be used to determine the composition and properties of materials using a variety of techniques. Most of these techniques represent extensions of earlier work performed with ordinary tube-type x-ray sources. The properties of the synchrotron source such as the continuous range of energy, high degree of photon polarization, pulsed beams, and photon flux many orders of magnitude higher than from x-ray tubes have made possible major advances in the possible ... continued below

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79 pages

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Jones, K. W. & Feng, H. December 2000.

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Description

High intensity synchrotron radiation produces photons with wavelengths that extend from the infrared to hard x rays with energies of hundreds of keV with uniquely high photon intensities that can be used to determine the composition and properties of materials using a variety of techniques. Most of these techniques represent extensions of earlier work performed with ordinary tube-type x-ray sources. The properties of the synchrotron source such as the continuous range of energy, high degree of photon polarization, pulsed beams, and photon flux many orders of magnitude higher than from x-ray tubes have made possible major advances in the possible chemical applications. We describe here ways that materials analyses can be made using the high intensity beams for measurements with small beam sizes and/or high detection sensitivity. The relevant characteristics of synchrotron x-ray sources are briefly summarized to give an idea of the x-ray parameters to be exploited. The experimental techniques considered include x-ray fluorescence, absorption, and diffraction. Examples of typical experimental apparatus used in these experiments are considered together with descriptions of actual applications.

Physical Description

79 pages

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  • Other Information: PUBLISHED IN : CHEMICAL APPLICATIONS OF SYNCHROTRON RADIATION, EDITOR T.K.RAM, WORLD SCIENTIFIC PUBLISHING CO., 2002

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  • Report No.: BNL--67588
  • Grant Number: AC02-98CH10886
  • Office of Scientific & Technical Information Report Number: 810525
  • Archival Resource Key: ark:/67531/metadc737702

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Office of Scientific & Technical Information Technical Reports

Reports, articles and other documents harvested from the Office of Scientific and Technical Information.

Office of Scientific and Technical Information (OSTI) is the Department of Energy (DOE) office that collects, preserves, and disseminates DOE-sponsored research and development (R&D) results that are the outcomes of R&D projects or other funded activities at DOE labs and facilities nationwide and grantees at universities and other institutions.

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  • December 2000

Added to The UNT Digital Library

  • Oct. 18, 2015, 6:40 p.m.

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  • Nov. 9, 2015, 1:17 p.m.

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Jones, K. W. & Feng, H. MICROANALYSIS OF MATERIALS USING SYNCHROTRON RADIATION., book, December 2000; Upton, New York. (digital.library.unt.edu/ark:/67531/metadc737702/: accessed December 16, 2018), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.