Production and characterization of x-ray speckle at sector 8 of the Advanced Photon Source.

PDF Version Also Available for Download.

Description

The authors have implemented in the undulator first-optics enclosure of the Massachusetts Institute of Technology-McGill University-IBM Corporation Collaborative Access Team Sector at the Advanced Photon Source an x-ray beamline and a spectrometer optimized for performing small-angle, wide-bandpass, coherent-x-ray-scattering experiments. They describe the novel features of this set-up. The performance of the beamline and the spectrometer has been characterized by measuring static x-ray speckle patterns from isotropically-discarded aerogels. Statistical analysis of the special patterns has been performed from which they extract the speckle widths and contrast versus wave-vector transfer and sample thickness. The measured speckle widths and contrast are compared to ... continued below

Physical Description

13 p.

Creation Information

Lurio, L. B.; Malik, A.; Mochrie, S. G.; Sandy, A. R.; Stephenson, G. B. & Sutton, M. June 2, 1998.

Context

This article is part of the collection entitled: Office of Scientific & Technical Information Technical Reports and was provided by UNT Libraries Government Documents Department to Digital Library, a digital repository hosted by the UNT Libraries. More information about this article can be viewed below.

Who

People and organizations associated with either the creation of this article or its content.

Sponsor

Publisher

Provided By

UNT Libraries Government Documents Department

Serving as both a federal and a state depository library, the UNT Libraries Government Documents Department maintains millions of items in a variety of formats. The department is a member of the FDLP Content Partnerships Program and an Affiliated Archive of the National Archives.

Contact Us

What

Descriptive information to help identify this article. Follow the links below to find similar items on the Digital Library.

Description

The authors have implemented in the undulator first-optics enclosure of the Massachusetts Institute of Technology-McGill University-IBM Corporation Collaborative Access Team Sector at the Advanced Photon Source an x-ray beamline and a spectrometer optimized for performing small-angle, wide-bandpass, coherent-x-ray-scattering experiments. They describe the novel features of this set-up. The performance of the beamline and the spectrometer has been characterized by measuring static x-ray speckle patterns from isotropically-discarded aerogels. Statistical analysis of the special patterns has been performed from which they extract the speckle widths and contrast versus wave-vector transfer and sample thickness. The measured speckle widths and contrast are compared to direct numerical evaluations of the intensity correlation function. The calculated widths are in poor agreement with the measurements but the calculated contrast agrees well with the measured contrast.

Physical Description

13 p.

Notes

INIS; OSTI as DE00008125

Medium: P; Size: 13 pages

Source

  • SPIE Conference on Coherent X-rays, San Diego, CA (US), 07/24/1997--07/31/1997

Language

Item Type

Identifier

Unique identifying numbers for this article in the Digital Library or other systems.

  • Report No.: ANL/MSD/CP-94385
  • Grant Number: W-31-109-ENG-38
  • Office of Scientific & Technical Information Report Number: 8125
  • Archival Resource Key: ark:/67531/metadc737688

Collections

This article is part of the following collection of related materials.

Office of Scientific & Technical Information Technical Reports

Reports, articles and other documents harvested from the Office of Scientific and Technical Information.

Office of Scientific and Technical Information (OSTI) is the Department of Energy (DOE) office that collects, preserves, and disseminates DOE-sponsored research and development (R&D) results that are the outcomes of R&D projects or other funded activities at DOE labs and facilities nationwide and grantees at universities and other institutions.

What responsibilities do I have when using this article?

When

Dates and time periods associated with this article.

Creation Date

  • June 2, 1998

Added to The UNT Digital Library

  • Oct. 18, 2015, 6:40 p.m.

Description Last Updated

  • April 7, 2017, 1:11 p.m.

Usage Statistics

When was this article last used?

Yesterday: 0
Past 30 days: 0
Total Uses: 6

Interact With This Article

Here are some suggestions for what to do next.

Start Reading

PDF Version Also Available for Download.

International Image Interoperability Framework

IIF Logo

We support the IIIF Presentation API

Lurio, L. B.; Malik, A.; Mochrie, S. G.; Sandy, A. R.; Stephenson, G. B. & Sutton, M. Production and characterization of x-ray speckle at sector 8 of the Advanced Photon Source., article, June 2, 1998; Illinois. (digital.library.unt.edu/ark:/67531/metadc737688/: accessed December 12, 2018), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.