Corrected RMS Error and Effective Number of Bits for Sinewave ADC Tests

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Description

A new definition is proposed for the effective number of bits of an ADC. This definition removes the variation in the calculated effective bits when the amplitude and offset of the sinewave test signal is slightly varied. This variation is most pronounced when test signals with amplitudes of a small number of code bin widths are applied to very low noise ADC's. The effectiveness of the proposed definition is compared with that of other proposed definitions over a range of signal amplitudes and noise levels.

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Blair, Jerome J. March 1, 2002.

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Description

A new definition is proposed for the effective number of bits of an ADC. This definition removes the variation in the calculated effective bits when the amplitude and offset of the sinewave test signal is slightly varied. This variation is most pronounced when test signals with amplitudes of a small number of code bin widths are applied to very low noise ADC's. The effectiveness of the proposed definition is compared with that of other proposed definitions over a range of signal amplitudes and noise levels.

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vp.

Notes

OSTI as DE00793153

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  • 4th International Conference on Advanced A/D and D/A Conversion Techniques and their Applications and 7th European Workshop on ADC Modeling and Testing, Prague (CZ), 06/26/2002--06/28/2002

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  • Report No.: DOE/NV/11718--672
  • Grant Number: AC08-96NV11718
  • Office of Scientific & Technical Information Report Number: 793153
  • Archival Resource Key: ark:/67531/metadc736991

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  • March 1, 2002

Added to The UNT Digital Library

  • Oct. 19, 2015, 7:39 p.m.

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  • Feb. 15, 2016, 11:27 a.m.

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Blair, Jerome J. Corrected RMS Error and Effective Number of Bits for Sinewave ADC Tests, article, March 1, 2002; Nevada. (digital.library.unt.edu/ark:/67531/metadc736991/: accessed August 16, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.