On the feasibility to investigate point defects by advanced electron microscopy

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Transmission Electron Microscopy evolves rapidly as a primary tool to investigate nano structures on a truly atomic level. Its resolution reaches into the sub Angstrom region by now. Together with a better correction of lens aberrations, sensitivities are drastically enhanced. Utilizing advanced electron microscopes, it is feasible to promote experiments that aim to detect single atoms. This enables local investigations of non-stoichiometry. This paper reviews the current state-of-the-art.

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Kisielowski, C. & Jinschek, J.R. October 2, 2002.

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Transmission Electron Microscopy evolves rapidly as a primary tool to investigate nano structures on a truly atomic level. Its resolution reaches into the sub Angstrom region by now. Together with a better correction of lens aberrations, sensitivities are drastically enhanced. Utilizing advanced electron microscopes, it is feasible to promote experiments that aim to detect single atoms. This enables local investigations of non-stoichiometry. This paper reviews the current state-of-the-art.

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OSTI as DE00808947

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  • 4th Symposium on non-stoichiometric III-V compounds, Asilomar, CA (US), 10/02/2002--10/04/2002

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  • Report No.: LBNL--52150
  • Grant Number: AC03-76SF00098
  • Office of Scientific & Technical Information Report Number: 808947
  • Archival Resource Key: ark:/67531/metadc736079

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Office of Scientific & Technical Information Technical Reports

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  • October 2, 2002

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  • Oct. 18, 2015, 6:40 p.m.

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  • April 4, 2016, 6:24 p.m.

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Kisielowski, C. & Jinschek, J.R. On the feasibility to investigate point defects by advanced electron microscopy, article, October 2, 2002; Berkeley, California. (digital.library.unt.edu/ark:/67531/metadc736079/: accessed November 24, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.