Development of a nanoindenter for in-situ transmission electron microscopy

PDF Version Also Available for Download.

Description

In-situ transmission electron microscopy is an established experimental technique that permits direct observation of the dynamics and mechanisms of dislocation motion and deformation behavior. In this paper, we detail the development of a novel specimen goniometer that allows real time observations of the mechanical response of materials to indentation loads. The technology of the scanning tunneling microscope is adopted to allow nanometer scale positioning of a sharp, conductive diamond tip onto the edge of an electron transparent sample. This allows application of loads to nanometer-scale material volumes couple with simultaneous imaging of the material response. The emphasis in this paper ... continued below

Physical Description

vp.

Creation Information

Stach, Eric A.; Freeman, Tony; Minor, Andrew M.; Owen, Doug K.; Cumings, John; Wall, Mark A. et al. January 30, 2001.

Context

This article is part of the collection entitled: Office of Scientific & Technical Information Technical Reports and was provided by UNT Libraries Government Documents Department to Digital Library, a digital repository hosted by the UNT Libraries. More information about this article can be viewed below.

Who

People and organizations associated with either the creation of this article or its content.

Sponsor

Publisher

Provided By

UNT Libraries Government Documents Department

Serving as both a federal and a state depository library, the UNT Libraries Government Documents Department maintains millions of items in a variety of formats. The department is a member of the FDLP Content Partnerships Program and an Affiliated Archive of the National Archives.

Contact Us

What

Descriptive information to help identify this article. Follow the links below to find similar items on the Digital Library.

Description

In-situ transmission electron microscopy is an established experimental technique that permits direct observation of the dynamics and mechanisms of dislocation motion and deformation behavior. In this paper, we detail the development of a novel specimen goniometer that allows real time observations of the mechanical response of materials to indentation loads. The technology of the scanning tunneling microscope is adopted to allow nanometer scale positioning of a sharp, conductive diamond tip onto the edge of an electron transparent sample. This allows application of loads to nanometer-scale material volumes couple with simultaneous imaging of the material response. The emphasis in this paper is experimental and descriptive, with particular attention given to sample geometry and other technical requirements. Examples of the deformation of aluminum and titanium carbide as well as the fracture of silicon will be presented.

Physical Description

vp.

Source

  • Journal Name: Microscopy and Microanalysis; Journal Volume: 7; Journal Issue: 06; Other Information: Journal Publication Date: November 2001

Language

Item Type

Identifier

Unique identifying numbers for this article in the Digital Library or other systems.

  • Report No.: LBNL--47402
  • Grant Number: AC03-76SF00098
  • Office of Scientific & Technical Information Report Number: 793742
  • Archival Resource Key: ark:/67531/metadc735790

Collections

This article is part of the following collection of related materials.

Office of Scientific & Technical Information Technical Reports

Reports, articles and other documents harvested from the Office of Scientific and Technical Information.

Office of Scientific and Technical Information (OSTI) is the Department of Energy (DOE) office that collects, preserves, and disseminates DOE-sponsored research and development (R&D) results that are the outcomes of R&D projects or other funded activities at DOE labs and facilities nationwide and grantees at universities and other institutions.

What responsibilities do I have when using this article?

When

Dates and time periods associated with this article.

Creation Date

  • January 30, 2001

Added to The UNT Digital Library

  • Oct. 19, 2015, 7:39 p.m.

Description Last Updated

  • April 4, 2016, 6:36 p.m.

Usage Statistics

When was this article last used?

Yesterday: 0
Past 30 days: 0
Total Uses: 8

Interact With This Article

Here are some suggestions for what to do next.

Start Reading

PDF Version Also Available for Download.

Citations, Rights, Re-Use

Stach, Eric A.; Freeman, Tony; Minor, Andrew M.; Owen, Doug K.; Cumings, John; Wall, Mark A. et al. Development of a nanoindenter for in-situ transmission electron microscopy, article, January 30, 2001; California. (digital.library.unt.edu/ark:/67531/metadc735790/: accessed November 18, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.