DIAGNOSIS OF EDGE LOCALIZED MODE EVOLUTION IN DIII-D USING FAST-GATED CID AND INFRARED CAMERAS

PDF Version Also Available for Download.

Description

The tangentially viewing visible and vertically viewing infrared cameras systems on DIII-D were upgraded to permit emission measurements during edge localized modes (ELMs) with integration times as short as 1 and 100 {micro}s respectively. The visible system was used to obtain 2-D poloidal profiles of CIII (465 nm) and D{sub {alpha}} (656.3 nm) emission with 20 {micro}s integration during various stages of ELM events in the lower DIII-D divertor. The infrared (IR) system was used to measure the heat flux to the divertor targets at 10 kHz with 100 {micro}s exposure. Upgrades to the data processing and storage systems permitted ... continued below

Physical Description

Medium: X; Size: 14 pages

Creation Information

GROTH, M.; FENSTERMACHER, M.E.; LASNIER, C.J.; HERNANDEZ, R.; MOELLER, J.M. & STURZ, R.A. August 1, 2002.

Context

This article is part of the collection entitled: Office of Scientific & Technical Information Technical Reports and was provided by UNT Libraries Government Documents Department to Digital Library, a digital repository hosted by the UNT Libraries. More information about this article can be viewed below.

Who

People and organizations associated with either the creation of this article or its content.

Sponsor

Publisher

Provided By

UNT Libraries Government Documents Department

Serving as both a federal and a state depository library, the UNT Libraries Government Documents Department maintains millions of items in a variety of formats. The department is a member of the FDLP Content Partnerships Program and an Affiliated Archive of the National Archives.

Contact Us

What

Descriptive information to help identify this article. Follow the links below to find similar items on the Digital Library.

Description

The tangentially viewing visible and vertically viewing infrared cameras systems on DIII-D were upgraded to permit emission measurements during edge localized modes (ELMs) with integration times as short as 1 and 100 {micro}s respectively. The visible system was used to obtain 2-D poloidal profiles of CIII (465 nm) and D{sub {alpha}} (656.3 nm) emission with 20 {micro}s integration during various stages of ELM events in the lower DIII-D divertor. The infrared (IR) system was used to measure the heat flux to the divertor targets at 10 kHz with 100 {micro}s exposure. Upgrades to the data processing and storage systems permitted efficient comparison of the temporal evolution of these measurements.

Physical Description

Medium: X; Size: 14 pages

Notes

Oakland Operations Office, Oakland, CA (US); INIS

Source

  • Fourteenth Topical Conference on High Temperature Plasma Diagnostics, Madison, WI (US), 07/08/2002--07/11/2002; Other Information: This is a preprint of a paper to be presented at the Fourteenth Topical Conference on High Temperature Plasma Diagnostics, July 8-11, 2002, Madison, Wisconsin, and to be published in the Proceedings.

Language

Item Type

Identifier

Unique identifying numbers for this article in the Digital Library or other systems.

  • Report No.: NONE
  • Grant Number: AC03-99ER54463
  • Office of Scientific & Technical Information Report Number: 804729
  • Archival Resource Key: ark:/67531/metadc735539

Collections

This article is part of the following collection of related materials.

Office of Scientific & Technical Information Technical Reports

Reports, articles and other documents harvested from the Office of Scientific and Technical Information.

Office of Scientific and Technical Information (OSTI) is the Department of Energy (DOE) office that collects, preserves, and disseminates DOE-sponsored research and development (R&D) results that are the outcomes of R&D projects or other funded activities at DOE labs and facilities nationwide and grantees at universities and other institutions.

What responsibilities do I have when using this article?

When

Dates and time periods associated with this article.

Creation Date

  • August 1, 2002

Added to The UNT Digital Library

  • Oct. 18, 2015, 6:40 p.m.

Description Last Updated

  • Jan. 3, 2017, 2:14 p.m.

Usage Statistics

When was this article last used?

Yesterday: 0
Past 30 days: 0
Total Uses: 5

Interact With This Article

Here are some suggestions for what to do next.

Start Reading

PDF Version Also Available for Download.

Citations, Rights, Re-Use

GROTH, M.; FENSTERMACHER, M.E.; LASNIER, C.J.; HERNANDEZ, R.; MOELLER, J.M. & STURZ, R.A. DIAGNOSIS OF EDGE LOCALIZED MODE EVOLUTION IN DIII-D USING FAST-GATED CID AND INFRARED CAMERAS, article, August 1, 2002; United States. (digital.library.unt.edu/ark:/67531/metadc735539/: accessed December 15, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.