Aberration correction for analytical in situ TEM - the NTEAM concept.

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Future aberration corrected transmission electron microscopes (TEM) will have a strong impact in materials science, since such microscopes yield information on chemical bonding and structure of interfaces, grain boundaries and lattice defects at an atomic level. Beyond this aberration correction offers new possibilities for in situ experiments performed under controlled temperature, magnetic field, strain etc. at atomic resolution. Such investigations are necessary for solving problems arising from electronic component miniaturization, for example. Significant progress can be expected by means of analytical aberration corrected TEM. These next generation microscopes will be equipped with an aberration corrected imaging system, a monochromator and ... continued below

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Kabius, B.; Allen, C. W. & Miller, D. J. March 5, 2002.

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Future aberration corrected transmission electron microscopes (TEM) will have a strong impact in materials science, since such microscopes yield information on chemical bonding and structure of interfaces, grain boundaries and lattice defects at an atomic level. Beyond this aberration correction offers new possibilities for in situ experiments performed under controlled temperature, magnetic field, strain etc. at atomic resolution. Such investigations are necessary for solving problems arising from electronic component miniaturization, for example. Significant progress can be expected by means of analytical aberration corrected TEM. These next generation microscopes will be equipped with an aberration corrected imaging system, a monochromator and aberration corrected energy filters. These novel elements have already been designed and partially realized [1,2,3].

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  • Microscopy and Microanalysis, Quebec City, Quebec (CA), 08/04/2002--08/08/2002

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  • Report No.: ANL/MSD/CP-107001
  • Grant Number: W-31-109-ENG-38
  • Office of Scientific & Technical Information Report Number: 799832
  • Archival Resource Key: ark:/67531/metadc735219

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  • March 5, 2002

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  • Oct. 19, 2015, 7:39 p.m.

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  • March 24, 2016, 5 p.m.

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Kabius, B.; Allen, C. W. & Miller, D. J. Aberration correction for analytical in situ TEM - the NTEAM concept., article, March 5, 2002; Illinois. (digital.library.unt.edu/ark:/67531/metadc735219/: accessed September 21, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.