Liquid-film assisted formation of alumina/niobium interfaces

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Alumina has been joined at 1400 degrees C using niobium-based interlayers. Two different joining approaches were compared: solid-state diffusion bonding using a niobium foil as an interlayer, and liquid-film assisted bonding using a multilayer copper/niobium/copper interlayer. In both cases, a 127-(mu)m thick niobium foil was used; =1.4-(mu)m or =3-(mu)m thick copper films flanked the niobium. Room-temperature four-point bend tests showed that the introduction of a copper film had a significant beneficial effect on the average strength and the strength distribution. Experiments using sapphire substrates indicated that during bonding the initially continuous copper film evolved into isolated copper-rich droplets/particles at the ... continued below

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Sugar, Joshua D.; McKeown, Joseph T.; Marks, Robert A. & Glaeser, Andreas M. June 16, 2002.

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Alumina has been joined at 1400 degrees C using niobium-based interlayers. Two different joining approaches were compared: solid-state diffusion bonding using a niobium foil as an interlayer, and liquid-film assisted bonding using a multilayer copper/niobium/copper interlayer. In both cases, a 127-(mu)m thick niobium foil was used; =1.4-(mu)m or =3-(mu)m thick copper films flanked the niobium. Room-temperature four-point bend tests showed that the introduction of a copper film had a significant beneficial effect on the average strength and the strength distribution. Experiments using sapphire substrates indicated that during bonding the initially continuous copper film evolved into isolated copper-rich droplets/particles at the sapphire/interlayer interface, and extensive regions of direct bonding between sapphire and niobium. Film breakup appeared to initiate at either niobium grain boundary ridges, or at asperities or irregularities on the niobium surface that caused localized contact with the sapphire.

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  • Journal Name: Journal of the American Ceramic Society; Journal Volume: 85; Journal Issue: 10; Other Information: Journal Publication Date: Oct. 2002

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  • Report No.: LBNL--48606
  • Grant Number: AC03-76SF00098
  • Office of Scientific & Technical Information Report Number: 806100
  • Archival Resource Key: ark:/67531/metadc735106

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Office of Scientific & Technical Information Technical Reports

Reports, articles and other documents harvested from the Office of Scientific and Technical Information.

Office of Scientific and Technical Information (OSTI) is the Department of Energy (DOE) office that collects, preserves, and disseminates DOE-sponsored research and development (R&D) results that are the outcomes of R&D projects or other funded activities at DOE labs and facilities nationwide and grantees at universities and other institutions.

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  • June 16, 2002

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  • Oct. 18, 2015, 6:40 p.m.

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  • April 4, 2016, 5:56 p.m.

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Sugar, Joshua D.; McKeown, Joseph T.; Marks, Robert A. & Glaeser, Andreas M. Liquid-film assisted formation of alumina/niobium interfaces, article, June 16, 2002; Berkeley, California. (digital.library.unt.edu/ark:/67531/metadc735106/: accessed December 13, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.