Beam Conditioning for FELs: Consequences and Methods Page: 1 of 28
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Beam Conditioning for FELs:
Consequences and Methods
A. Wolski, G. Penn, A. Sessler, J. Wurtele*
Ernest Orlando Lawrence Berkeley National Laboratory, Berkeley, CA 94720
October 9", 2003
The consequences of beam conditioning in four example cases (VISA, a Soft X-Ray
FEL, LCLS and a "Greenfield"FEL) are examined. It is shown that in emittance limited
cases, proper conditioning reduces sensitivity to the transverse emittance, and allows
stronger focusing in the undulator. Simulations show higher saturation power, with gain
lengths reduced up to a factor of two. The beam dynamics in a general conditioning
system are studied, with "matching conditions" derived for achieving conditioning
without growth in effective emittance. Various conditioners are considered, and
expressions derived for the amount of conditioning provided in each case when the
matching conditions are satisfied. We discuss the prospects for conditioners based on
laser and plasma systems.
This document was prepared as an account of work sponsored by the United States Government.
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This work was supported by the Director, Office of Science, of the U.S. Department of Energy
under Contract No. DE-AC03-76SF00098.
*Also at University of California, Berkeley, Department of Physics.
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Wolski, Andrzej; Penn, Gregory; Sessler, Andrew & Wurtele, Jonathan. Beam Conditioning for FELs: Consequences and Methods, report, October 9, 2003; Berkeley, California. (digital.library.unt.edu/ark:/67531/metadc734852/m1/1/: accessed January 24, 2019), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.