Beam test results for the BTeV silicon pixel detector

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The authors report the results of the BTeV silicon pixel detector tests carried out in the MTest beam at Fermilab in 1999--2000. The pixel detector spatial resolution has been studied as a function of track inclination, sensor bias, and readout threshold.

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85 Kilobytes pages

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Jeffrey A. Appel, G. Chiodini et al. September 28, 2000.

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Description

The authors report the results of the BTeV silicon pixel detector tests carried out in the MTest beam at Fermilab in 1999--2000. The pixel detector spatial resolution has been studied as a function of track inclination, sensor bias, and readout threshold.

Physical Description

85 Kilobytes pages

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  • ICHEP-2000, Osaka (JP), 07/27/2000--08/02/2000

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  • Report No.: FERMILAB-Conf-00/227-E
  • Grant Number: AC02-76CH03000
  • Office of Scientific & Technical Information Report Number: 764083
  • Archival Resource Key: ark:/67531/metadc724752

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Office of Scientific & Technical Information Technical Reports

Reports, articles and other documents harvested from the Office of Scientific and Technical Information.

Office of Scientific and Technical Information (OSTI) is the Department of Energy (DOE) office that collects, preserves, and disseminates DOE-sponsored research and development (R&D) results that are the outcomes of R&D projects or other funded activities at DOE labs and facilities nationwide and grantees at universities and other institutions.

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  • September 28, 2000

Added to The UNT Digital Library

  • Sept. 29, 2015, 5:31 a.m.

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  • April 1, 2016, 3:40 p.m.

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Jeffrey A. Appel, G. Chiodini et al. Beam test results for the BTeV silicon pixel detector, article, September 28, 2000; Batavia, Illinois. (digital.library.unt.edu/ark:/67531/metadc724752/: accessed October 16, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.