Single event effects in the pixel readout chip for BTeV

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In future experiments the readout electronics for pixel detectors is required to be resistant to a very high radiation level. In this paper we report on irradiation tests performed on several preFPIX2 prototype pixel readout chips for the BTeV experiment exposed to a 200 MeV proton beam. The prototype chips have been implemented in commercial 0.25 {micro}m CMOS processes following radiation tolerant design rules. The results show that this ASIC design tolerates a large total radiation dose, and that radiation induced Single Event Effects occur at a manageable level.

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236 Kilobytes pages

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al., Gabriele Chiodini et December 7, 2001.

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In future experiments the readout electronics for pixel detectors is required to be resistant to a very high radiation level. In this paper we report on irradiation tests performed on several preFPIX2 prototype pixel readout chips for the BTeV experiment exposed to a 200 MeV proton beam. The prototype chips have been implemented in commercial 0.25 {micro}m CMOS processes following radiation tolerant design rules. The results show that this ASIC design tolerates a large total radiation dose, and that radiation induced Single Event Effects occur at a manageable level.

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236 Kilobytes pages

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  • 10th INTERNATIONAL WORKSHOP ON VERTEX DETECTORS, VERTEX 2001, Brunnen (CH), 09/23/2001--09/28/2001

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  • Report No.: FERMILAB-Conf-01/369-E
  • Grant Number: AC02-76CH03000
  • Office of Scientific & Technical Information Report Number: 789373
  • Archival Resource Key: ark:/67531/metadc724461

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Office of Scientific & Technical Information Technical Reports

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  • December 7, 2001

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  • Sept. 29, 2015, 5:31 a.m.

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  • April 1, 2016, 5:53 p.m.

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al., Gabriele Chiodini et. Single event effects in the pixel readout chip for BTeV, article, December 7, 2001; Batavia, Illinois. (digital.library.unt.edu/ark:/67531/metadc724461/: accessed November 24, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.