Scanning Nearfield Infrared Microscopy

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Commonly, location specific chemical identification by means of vibrational spectroscopy in the infrared region is largely restricted to samples of macroscopic dimensions, on the order of one to several microns; the scale of the examined area is completely determined by the diffraction limit of the incident radiation. However, chemical identification at length scales less than the diffraction limit is possible using a scanned probe technique, the Scanning Near-Field Infrared Microscope (SNFIM). Using a scanned probe technique in the near-field, resolution of chemical features on the order of h/20 or {approximately} 100 nm can be achieved. An overview of previous experimental ... continued below

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245 Kilobytes pages

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Gillman, Edward March 1, 2001.

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Description

Commonly, location specific chemical identification by means of vibrational spectroscopy in the infrared region is largely restricted to samples of macroscopic dimensions, on the order of one to several microns; the scale of the examined area is completely determined by the diffraction limit of the incident radiation. However, chemical identification at length scales less than the diffraction limit is possible using a scanned probe technique, the Scanning Near-Field Infrared Microscope (SNFIM). Using a scanned probe technique in the near-field, resolution of chemical features on the order of h/20 or {approximately} 100 nm can be achieved. An overview of previous experimental results using a free electron laser (FEL) and more conventional infrared sources will be discussed. Recent results from the SNFIM experiment at Jefferson Lab will also be presented.

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245 Kilobytes pages

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  • The Electrochemical Society, Washington, DC (US), 03/2001

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  • Report No.: JLAB-ACC-00-12
  • Report No.: DOE/ER/40150-1846
  • Grant Number: AC05-84ER40150
  • Office of Scientific & Technical Information Report Number: 781121
  • Archival Resource Key: ark:/67531/metadc722716

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  • March 1, 2001

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  • Sept. 29, 2015, 5:31 a.m.

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  • Feb. 5, 2016, 9:44 p.m.

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Gillman, Edward. Scanning Nearfield Infrared Microscopy, article, March 1, 2001; Newport News, Virginia. (digital.library.unt.edu/ark:/67531/metadc722716/: accessed September 25, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.