Nanocrystal Thickness Information from Z-Stem: 3-D Imaging in One Shot

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The authors have applied Atomic Number Contrast Scanning Transmission Electron Microscopy (Z-Contrast STEM) towards the study of colloidal CdSe semiconductor nanocrystals embedded in MEH-PPV polymer films. For typical nanocrystal thicknesses, the image intensity is a monotonic function of thickness. Hence an atomic column-resolved image provides information both on the lateral shape of the nanocrystal, as well as the relative thickness of the individual columns. They show that the Z-Contrast image of a single CdSe nanocrystal is consistent with the predicted 3-D model derived from considering HRTEM images of several nanocrystals in different orientations. They further discuss the possibility of measuring ... continued below

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7 pages

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Kadavanich, A.V.; Kippeny, Tl; Erwin, M.; Rosenthal, S.J. & Pennycook, S.J. November 29, 1999.

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The authors have applied Atomic Number Contrast Scanning Transmission Electron Microscopy (Z-Contrast STEM) towards the study of colloidal CdSe semiconductor nanocrystals embedded in MEH-PPV polymer films. For typical nanocrystal thicknesses, the image intensity is a monotonic function of thickness. Hence an atomic column-resolved image provides information both on the lateral shape of the nanocrystal, as well as the relative thickness of the individual columns. They show that the Z-Contrast image of a single CdSe nanocrystal is consistent with the predicted 3-D model derived from considering HRTEM images of several nanocrystals in different orientations. They further discuss the possibility of measuring absolute thicknesses of atomic columns if the crystal structure is known.

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7 pages

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OSTI as DE00771410

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  • Materials Research Society Fall 1999 Meeting, Boston, MA (US), 11/29/1999--12/03/1999

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  • Report No.: P00-106827
  • Grant Number: AC05-00OR22725
  • Office of Scientific & Technical Information Report Number: 771410
  • Archival Resource Key: ark:/67531/metadc720703

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Office of Scientific & Technical Information Technical Reports

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  • November 29, 1999

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  • Sept. 29, 2015, 5:31 a.m.

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  • Jan. 19, 2016, 8:23 p.m.

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Kadavanich, A.V.; Kippeny, Tl; Erwin, M.; Rosenthal, S.J. & Pennycook, S.J. Nanocrystal Thickness Information from Z-Stem: 3-D Imaging in One Shot, article, November 29, 1999; Tennessee. (digital.library.unt.edu/ark:/67531/metadc720703/: accessed December 10, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.