Nanostructure of a-Si:H and Related Alloys by Small-Angle Scattering of Neutrons and X-Rays; Annual Technical Progress Report, May 22, 1999 to August 21, 2000

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This report describes work being performed to provide details of the microstructure in high-quality hydrogenated amorphous and microcrystalline silicon and related alloys on the nanometer size scale. The materials under study are being prepared by current state-of-the-art deposition methods, as well as by new and emerging deposition techniques. The purpose is to establish the role of nanostructural features in controlling the opto-electronic and photovoltaic properties. The approach centers around the use of the uncommon technique of small-angle scattering of both X-rays (SAXS) and neutrons (SANS). SAXS has already been established as highly sensitive to microvoids and columnar-like microstructure. A major ... continued below

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Williamson, D. October 30, 2000.

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Description

This report describes work being performed to provide details of the microstructure in high-quality hydrogenated amorphous and microcrystalline silicon and related alloys on the nanometer size scale. The materials under study are being prepared by current state-of-the-art deposition methods, as well as by new and emerging deposition techniques. The purpose is to establish the role of nanostructural features in controlling the opto-electronic and photovoltaic properties. The approach centers around the use of the uncommon technique of small-angle scattering of both X-rays (SAXS) and neutrons (SANS). SAXS has already been established as highly sensitive to microvoids and columnar-like microstructure. A major goal of this research is to establish how sensitive SANS is to the hydrogen nanostructure. Conventional X-ray diffraction techniques are being used to examine medium-range order and microcrystallinity, particularly near the boundary between amorphous and microcrystalline material.

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  • Other Information: PBD: 30 Oct 2000

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  • Report No.: NREL/SR-520-29121
  • Grant Number: AC36-99GO10337
  • DOI: 10.2172/767314 | External Link
  • Office of Scientific & Technical Information Report Number: 767314
  • Archival Resource Key: ark:/67531/metadc718718

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  • October 30, 2000

Added to The UNT Digital Library

  • Sept. 29, 2015, 5:31 a.m.

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  • March 28, 2016, 8:29 p.m.

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Williamson, D. Nanostructure of a-Si:H and Related Alloys by Small-Angle Scattering of Neutrons and X-Rays; Annual Technical Progress Report, May 22, 1999 to August 21, 2000, report, October 30, 2000; Golden, Colorado. (digital.library.unt.edu/ark:/67531/metadc718718/: accessed August 19, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.