Creep in electronic ceramics

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Description

High-temperature creep measurements combined with microstructural investigations can be used to elucidate deformation mechanisms that can be related to the diffusion kinetics and defect chemistry of the minority species. This paper will review the theoretical basis for this correlation and illustrate it with examples from some important electronic ceramics having a perovskite structure. Recent results on BaTiO{sub 3}, (La{sub 1{minus}x}Sr){sub 1{minus}y}MnO{sub 3+{delta}}, YBa{sub 2}Cu{sub 3}O{sub x}, Bi{sub 2}Sr{sub 2}CaCu{sub 2}O{sub x}, (Bi,Pb){sub 2}Sr{sub 2}Ca{sub 2}Cu{sub 3}O{sub x} and Sr(Fe,Co){sub 1.5}O{sub x} will be presented.

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15 p.

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Routbort, J. L.; Goretta, K. C. & Arellano-Lopez, A. R. April 27, 2000.

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This article is part of the collection entitled: Office of Scientific & Technical Information Technical Reports and was provided by UNT Libraries Government Documents Department to Digital Library, a digital repository hosted by the UNT Libraries. More information about this article can be viewed below.


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Description

High-temperature creep measurements combined with microstructural investigations can be used to elucidate deformation mechanisms that can be related to the diffusion kinetics and defect chemistry of the minority species. This paper will review the theoretical basis for this correlation and illustrate it with examples from some important electronic ceramics having a perovskite structure. Recent results on BaTiO{sub 3}, (La{sub 1{minus}x}Sr){sub 1{minus}y}MnO{sub 3+{delta}}, YBa{sub 2}Cu{sub 3}O{sub x}, Bi{sub 2}Sr{sub 2}CaCu{sub 2}O{sub x}, (Bi,Pb){sub 2}Sr{sub 2}Ca{sub 2}Cu{sub 3}O{sub x} and Sr(Fe,Co){sub 1.5}O{sub x} will be presented.

Physical Description

15 p.

Notes

OSTI as DE00755861

Medium: P; Size: 15 pages

Source

  • International Conference on Mass and Charge Transport in Inorganic Materials, Fundamentals to Devices, Venice (IT), 05/28/2000--06/02/2000

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  • Report No.: ANL/ET/CP-101735
  • Grant Number: W-31109-ENG-38
  • Office of Scientific & Technical Information Report Number: 755861
  • Archival Resource Key: ark:/67531/metadc712228

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  • April 27, 2000

Added to The UNT Digital Library

  • Sept. 12, 2015, 6:31 a.m.

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  • April 7, 2017, 2:57 p.m.

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Routbort, J. L.; Goretta, K. C. & Arellano-Lopez, A. R. Creep in electronic ceramics, article, April 27, 2000; Illinois. (digital.library.unt.edu/ark:/67531/metadc712228/: accessed September 24, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.