Nanostructure of a-Si:H and related alloys by small-angle scattering of neutrons and X-rays: Annual technical progress report: May 22, 1998 -- May 21, 1999

PDF Version Also Available for Download.

Description

This report describes work being performed to provide details of the microstructure in high-quality hydrogenated amorphous silicon and related alloys on the nanometer scale. The materials under study are being prepared by state-of-the-art deposition methods, as well as by new and emerging deposition techniques. The purpose is to establish the role of nanostructural features in controlling opto-electronic and photovoltaic properties. The approach centers around the use of the uncommon technique of small-angle scattering of both X-rays (SAXS) and neutrons (SANS). SAXS has already been established as highly sensitive to microvoids and columnar-like microstructure. A major goal of this research is ... continued below

Physical Description

vp.

Creation Information

Williamson, D. L. December 21, 1999.

Context

This report is part of the collection entitled: Office of Scientific & Technical Information Technical Reports and was provided by UNT Libraries Government Documents Department to Digital Library, a digital repository hosted by the UNT Libraries. More information about this report can be viewed below.

Who

People and organizations associated with either the creation of this report or its content.

Sponsor

Publisher

Provided By

UNT Libraries Government Documents Department

Serving as both a federal and a state depository library, the UNT Libraries Government Documents Department maintains millions of items in a variety of formats. The department is a member of the FDLP Content Partnerships Program and an Affiliated Archive of the National Archives.

Contact Us

What

Descriptive information to help identify this report. Follow the links below to find similar items on the Digital Library.

Description

This report describes work being performed to provide details of the microstructure in high-quality hydrogenated amorphous silicon and related alloys on the nanometer scale. The materials under study are being prepared by state-of-the-art deposition methods, as well as by new and emerging deposition techniques. The purpose is to establish the role of nanostructural features in controlling opto-electronic and photovoltaic properties. The approach centers around the use of the uncommon technique of small-angle scattering of both X-rays (SAXS) and neutrons (SANS). SAXS has already been established as highly sensitive to microvoids and columnar-like microstructure. A major goal of this research is to establish the sensitivity of SANS to the hydrogen nanostructure. Conventional X-ray diffraction techniques are being used to examine medium-range order and microcrystallinity, particularly near the boundary between amorphous and microcrystalline material.

Physical Description

vp.

Source

  • Other Information: PBD: 21 Dec 1999

Language

Item Type

Identifier

Unique identifying numbers for this report in the Digital Library or other systems.

  • Report No.: NREL/SR-520-27664
  • Grant Number: AC36-99GO10337
  • DOI: 10.2172/754641 | External Link
  • Office of Scientific & Technical Information Report Number: 754641
  • Archival Resource Key: ark:/67531/metadc712025

Collections

This report is part of the following collection of related materials.

Office of Scientific & Technical Information Technical Reports

What responsibilities do I have when using this report?

When

Dates and time periods associated with this report.

Creation Date

  • December 21, 1999

Added to The UNT Digital Library

  • Sept. 12, 2015, 6:31 a.m.

Description Last Updated

  • March 28, 2016, 8:29 p.m.

Usage Statistics

When was this report last used?

Yesterday: 0
Past 30 days: 0
Total Uses: 6

Interact With This Report

Here are some suggestions for what to do next.

Start Reading

PDF Version Also Available for Download.

Citations, Rights, Re-Use

Williamson, D. L. Nanostructure of a-Si:H and related alloys by small-angle scattering of neutrons and X-rays: Annual technical progress report: May 22, 1998 -- May 21, 1999, report, December 21, 1999; Golden, Colorado. (digital.library.unt.edu/ark:/67531/metadc712025/: accessed September 21, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.