A large statistics study of the performance and yields of generation-6 VLPCs (HISTE-VI)

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In this paper, the D0 collaboration reports on the test results of 142 880 VLPC pixels. The authors have explored the space of operating conditions and find good performance at a temperature of 9 K and an average bias voltage of 7 V. Preliminary tests have shown an average quantum efficiency of 80% and a gain of 20 000 -- 60 000. Tests have shown that the devices can be made to work at very high rates. The pixel-to-pixel variation within a chip is manageable, allowing one to assemble like-performing VLPC chips into cassettes containing 1024 pixels each.

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70 Kilobytes pages

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Lincoln, Don June 23, 2000.

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In this paper, the D0 collaboration reports on the test results of 142 880 VLPC pixels. The authors have explored the space of operating conditions and find good performance at a temperature of 9 K and an average bias voltage of 7 V. Preliminary tests have shown an average quantum efficiency of 80% and a gain of 20 000 -- 60 000. Tests have shown that the devices can be made to work at very high rates. The pixel-to-pixel variation within a chip is manageable, allowing one to assemble like-performing VLPC chips into cassettes containing 1024 pixels each.

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70 Kilobytes pages

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  • 7th International Conference on Instrumentation for Colliding Beam Physics, Hamamatsu (JP), 11/15/1999--11/19/1999

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  • Report No.: FERMILAV-Conf-99/383-E
  • Grant Number: AC02-76CH03000
  • Office of Scientific & Technical Information Report Number: 757013
  • Archival Resource Key: ark:/67531/metadc712024

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  • June 23, 2000

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  • Sept. 12, 2015, 6:31 a.m.

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  • April 1, 2016, 6:52 p.m.

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Lincoln, Don. A large statistics study of the performance and yields of generation-6 VLPCs (HISTE-VI), article, June 23, 2000; Batavia, Illinois. (digital.library.unt.edu/ark:/67531/metadc712024/: accessed August 22, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.