AFM studies of a new type of radiation defect on mica surfaces caused by highly charged ion impact

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Radiation induced defects on mica caused by the impact of slow very highly charged ions (SVHCI) have been investigated with an atomic force microscope (AFM). Freshly cleaved surfaces of different types of muscovite were irradiated with SVHCI extracted from the LLNL electron beam ion trap (EBIT) at velocities of ca. 2 keV/amu. Atomic force microscopy of the surface reveals the formation of blisterlike defects associated with single ion impact. The determined defect volume which appears to increase linearly with the incident charge state and exhibits a threshold incident charge state has been determined using the AFM. These results indicate that ... continued below

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14 p.

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Ruehlicke, C.; Briere, M.A. & Schneider, D. September 28, 1994.

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Description

Radiation induced defects on mica caused by the impact of slow very highly charged ions (SVHCI) have been investigated with an atomic force microscope (AFM). Freshly cleaved surfaces of different types of muscovite were irradiated with SVHCI extracted from the LLNL electron beam ion trap (EBIT) at velocities of ca. 2 keV/amu. Atomic force microscopy of the surface reveals the formation of blisterlike defects associated with single ion impact. The determined defect volume which appears to increase linearly with the incident charge state and exhibits a threshold incident charge state has been determined using the AFM. These results indicate that target atoms are subjected to mutual electrostatic repulsion due to ionization through potential electron emission upon approach of the ion. If the repulsion leads to permanent atomic displacement, surface defects are formed.

Physical Description

14 p.

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INIS; OSTI as DE95011536

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  • 13. international conference on the application of accelerators in research and industry, Denton, TX (United States), 7-10 Nov 1994

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  • Other: DE95011536
  • Report No.: UCRL-JC--118776
  • Report No.: CONF-941129--24
  • Grant Number: W-7405-ENG-48
  • DOI: 10.2172/71369 | External Link
  • Office of Scientific & Technical Information Report Number: 71369
  • Archival Resource Key: ark:/67531/metadc711612

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Office of Scientific & Technical Information Technical Reports

Reports, articles and other documents harvested from the Office of Scientific and Technical Information.

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Creation Date

  • September 28, 1994

Added to The UNT Digital Library

  • Sept. 12, 2015, 6:31 a.m.

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  • Feb. 16, 2016, 1:37 p.m.

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Ruehlicke, C.; Briere, M.A. & Schneider, D. AFM studies of a new type of radiation defect on mica surfaces caused by highly charged ion impact, report, September 28, 1994; California. (digital.library.unt.edu/ark:/67531/metadc711612/: accessed December 16, 2018), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.