Interfacial force microscopy: Application to polymer surfaces Metadata
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Title
- Main Title Interfacial force microscopy: Application to polymer surfaces
Creator
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Author: HOUSTON,JACK E.Creator Type: Personal
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Author: WINTER,R.M.Creator Type: Personal
Contributor
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Sponsor: United States. Department of Energy.Contributor Type: OrganizationContributor Info: US Department of Energy (United States)
Publisher
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Name: Sandia National LaboratoriesPlace of Publication: Albuquerque, New MexicoAdditional Info: Sandia National Labs., Albuquerque, NM, and Livermore, CA (United States)
Date
- Creation: 2000-05-16
Language
- English
Description
- Content Description: Scanning-probe microscopies (SPM) are presently widely used in remarkably diverse applications and, as evidenced by this symposium these techniques are rapidly expanding into the important areas of polymer surfaces and interfaces. The Atomic Force Microscope (AFM) is presently the most widely used of the scanning-probe techniques. However, the AFM's range of application suffers from an inherent mechanical instability in its deflection force sensor. The instability problem has been overcome by the development of the Interfacial Force Microscope (IFM), which utilizes a force-feedback sensor concept. In the following, the authors present several examples of polymer applications to illustrate the utility of the IFM sensor concept.
- Physical Description: 2 p.
Subject
- Keyword: Modifications
- Keyword: Polymers
- STI Subject Categories: 37 Inorganic, Organic, Physical And Analytical Chemistry
- STI Subject Categories: 36 Materials Science
- Keyword: Atomic Force Microscopy
- Keyword: Surface Properties
- Keyword: Performance
Source
- Journal Name: Polymer Preprints; Other Information: Submitted to Polymer Preprints 2000, 41(2)
Collection
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Name: Office of Scientific & Technical Information Technical ReportsCode: OSTI
Institution
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Name: UNT Libraries Government Documents DepartmentCode: UNTGD
Resource Type
- Article
Format
- Text
Identifier
- Report No.: SAND2000-1230J
- Grant Number: AC04-94AL85000
- Office of Scientific & Technical Information Report Number: 755612
- Archival Resource Key: ark:/67531/metadc710946
Note
- Display Note: OSTI as DE00755612
- Display Note: Medium: P; Size: 2 pages