Interfacial force microscopy: Application to polymer surfaces

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Description

Scanning-probe microscopies (SPM) are presently widely used in remarkably diverse applications and, as evidenced by this symposium these techniques are rapidly expanding into the important areas of polymer surfaces and interfaces. The Atomic Force Microscope (AFM) is presently the most widely used of the scanning-probe techniques. However, the AFM's range of application suffers from an inherent mechanical instability in its deflection force sensor. The instability problem has been overcome by the development of the Interfacial Force Microscope (IFM), which utilizes a force-feedback sensor concept. In the following, the authors present several examples of polymer applications to illustrate the utility of ... continued below

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2 p.

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HOUSTON,JACK E. & WINTER,R.M. May 16, 2000.

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This article is part of the collection entitled: Office of Scientific & Technical Information Technical Reports and was provided by UNT Libraries Government Documents Department to Digital Library, a digital repository hosted by the UNT Libraries. More information about this article can be viewed below.

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  • Sandia National Laboratories
    Publisher Info: Sandia National Labs., Albuquerque, NM, and Livermore, CA (United States)
    Place of Publication: Albuquerque, New Mexico

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Description

Scanning-probe microscopies (SPM) are presently widely used in remarkably diverse applications and, as evidenced by this symposium these techniques are rapidly expanding into the important areas of polymer surfaces and interfaces. The Atomic Force Microscope (AFM) is presently the most widely used of the scanning-probe techniques. However, the AFM's range of application suffers from an inherent mechanical instability in its deflection force sensor. The instability problem has been overcome by the development of the Interfacial Force Microscope (IFM), which utilizes a force-feedback sensor concept. In the following, the authors present several examples of polymer applications to illustrate the utility of the IFM sensor concept.

Physical Description

2 p.

Notes

OSTI as DE00755612

Medium: P; Size: 2 pages

Source

  • Journal Name: Polymer Preprints; Other Information: Submitted to Polymer Preprints 2000, 41(2)

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  • Report No.: SAND2000-1230J
  • Grant Number: AC04-94AL85000
  • Office of Scientific & Technical Information Report Number: 755612
  • Archival Resource Key: ark:/67531/metadc710946

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  • May 16, 2000

Added to The UNT Digital Library

  • Sept. 12, 2015, 6:31 a.m.

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  • April 10, 2017, 3:01 p.m.

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HOUSTON,JACK E. & WINTER,R.M. Interfacial force microscopy: Application to polymer surfaces, article, May 16, 2000; Albuquerque, New Mexico. (digital.library.unt.edu/ark:/67531/metadc710946/: accessed September 24, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.