XPS: A multi-channel preamplifier shaper IC for X-ray spectroscopy

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Description

An integrated circuit featuring 48 channels of charge-sensitive preamplifiers followed by variable-gain pulse shaping amplifiers is being developed as part of an x-ray spectrometer with a highly segmented detector to handle high fluxes in synchrotron experiments. Such detector systems can provide excellent energy resolution combined with one-dimensional spatial information. The IC combines many basic spectroscopy amplifier functions with a low-noise preamplifier section to produce a unique circuit capable of driving conventional ADC modules directly. An important feature of the design is the novel CR-RC{sup 2} pulse shaper. In this section, high-linearity transconductor circuits are required in order to provide a ... continued below

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4 p.

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Krieger, B.; Kipnis, I. & Ludewigt, B.A. November 1, 1997.

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Description

An integrated circuit featuring 48 channels of charge-sensitive preamplifiers followed by variable-gain pulse shaping amplifiers is being developed as part of an x-ray spectrometer with a highly segmented detector to handle high fluxes in synchrotron experiments. Such detector systems can provide excellent energy resolution combined with one-dimensional spatial information. The IC combines many basic spectroscopy amplifier functions with a low-noise preamplifier section to produce a unique circuit capable of driving conventional ADC modules directly. An important feature of the design is the novel CR-RC{sup 2} pulse shaper. In this section, high-linearity transconductor circuits are required in order to provide a broad range of continuously variable peaking times while still maintaining the linearity and noise performance necessary for x-ray spectroscopy. Reported here are first measurements made on the performance of a 16-channel prototype integrated circuit. At present, the preamplifier-shaper circuit achieves an equivalent input noise of 26 electrons rms at 2 {micro}s peaking time with a 0.2 pF external capacitor, which is similar to the capacitance of a single detector element. The design was fabricated in standard 1.2 {micro}m CMOS technology.

Physical Description

4 p.

Notes

INIS; OSTI as DE98056093

Source

  • Institute of Electrical and Electronic Engineers (IEEE) nuclear science symposium and medical imaging conference, Albuquerque, NM (United States), 11-13 Nov 1997

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  • Other: DE98056093
  • Report No.: LBNL--39990-Rev.
  • Report No.: CONF-971147--
  • Grant Number: AC03-76SF00098
  • Office of Scientific & Technical Information Report Number: 666027
  • Archival Resource Key: ark:/67531/metadc710937

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  • November 1, 1997

Added to The UNT Digital Library

  • Sept. 12, 2015, 6:31 a.m.

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  • Nov. 5, 2015, 7:24 p.m.

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Krieger, B.; Kipnis, I. & Ludewigt, B.A. XPS: A multi-channel preamplifier shaper IC for X-ray spectroscopy, article, November 1, 1997; United States. (digital.library.unt.edu/ark:/67531/metadc710937/: accessed September 21, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.