Error reduction techniques for measuring long synchrotron mirrors

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Many instruments and techniques are used for measuring long mirror surfaces. A Fizeau interferometer may be used to measure mirrors much longer than the interferometer aperture size by using grazing incidence at the mirror surface and analyzing the light reflected from a flat end mirror. Advantages of this technique are data acquisition speed and use of a common instrument. Disadvantages are reduced sampling interval, uncertainty of tangential position, and sagittal/tangential aspect ratio other than unity. Also, deep aspheric surfaces cannot be measured on a Fizeau interferometer without a specially made fringe nulling holographic plate. Other scanning instruments have been developed ... continued below

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14 p.

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Irick, S. July 1998.

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Description

Many instruments and techniques are used for measuring long mirror surfaces. A Fizeau interferometer may be used to measure mirrors much longer than the interferometer aperture size by using grazing incidence at the mirror surface and analyzing the light reflected from a flat end mirror. Advantages of this technique are data acquisition speed and use of a common instrument. Disadvantages are reduced sampling interval, uncertainty of tangential position, and sagittal/tangential aspect ratio other than unity. Also, deep aspheric surfaces cannot be measured on a Fizeau interferometer without a specially made fringe nulling holographic plate. Other scanning instruments have been developed for measuring height, slope, or curvature profiles of the surface, but lack accuracy for very long scans required for X-ray synchrotron mirrors. The Long Trace Profiler (LTP) was developed specifically for long x-ray mirror measurement, and still outperforms other instruments, especially for aspheres. Thus, this paper focuses on error reduction techniques for the LTP.

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14 p.

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INIS; OSTI as DE98059382

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  • 43. international symposium on optical science, engineering, and instrumentation, San Diego, CA (United States), 19-24 Jul 1998

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  • Other: DE98059382
  • Report No.: LBNL--42097
  • Report No.: LSBL--479;CONF-980731--
  • Grant Number: AC03-76SF00098
  • Office of Scientific & Technical Information Report Number: 666054
  • Archival Resource Key: ark:/67531/metadc709991

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Reports, articles and other documents harvested from the Office of Scientific and Technical Information.

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  • July 1998

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  • Sept. 12, 2015, 6:31 a.m.

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  • April 5, 2016, 12:04 p.m.

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Irick, S. Error reduction techniques for measuring long synchrotron mirrors, article, July 1998; Berkeley, California. (digital.library.unt.edu/ark:/67531/metadc709991/: accessed October 20, 2018), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.