Progress towards sub-micron hard x-ray imaging using elliptically bent mirrors and its applications

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The authors have developed an x-ray micro-probe facility utilizing mirror bending techniques that allow white light x-rays (4--12keV) from the Advanced light Source Synchrotron to be focused down to spot sizes of micron spatial dimensions. They have installed a 4 crystal monochromator prior to the micro-focusing mirrors. The monochromator is designed such that it can move out of the way of the input beam, and allows the same micron sized sample to be illuminated with either white or monochromatic radiation. Illumination of the sample with white light allows for elemental mapping and Laue x-ray diffraction, while illumination of the sample ... continued below

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9 p.

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MacDowell, A. A.; Lamble, G. M.; Celestre, R. S.; Padmore, H. A.; Chang, C. H. & Patel, J. R. June 1998.

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Description

The authors have developed an x-ray micro-probe facility utilizing mirror bending techniques that allow white light x-rays (4--12keV) from the Advanced light Source Synchrotron to be focused down to spot sizes of micron spatial dimensions. They have installed a 4 crystal monochromator prior to the micro-focusing mirrors. The monochromator is designed such that it can move out of the way of the input beam, and allows the same micron sized sample to be illuminated with either white or monochromatic radiation. Illumination of the sample with white light allows for elemental mapping and Laue x-ray diffraction, while illumination of the sample with monochromatic light allows for elemental mapping (with reduced background), micro-X-ray absorption spectroscopy and micro-diffraction. The performance of the system will be described as will some of the initial experiments that cover the various disciplines of Earth, Material and Life Sciences.

Physical Description

9 p.

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INIS; OSTI as DE98059379

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  • 43. international symposium on optical science, engineering, and instrumentation, San Diego, CA (United States), 19-24 Jul 1998

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  • Other: DE98059379
  • Report No.: LBNL--42032
  • Report No.: LSBL--478;CONF-980731--
  • Grant Number: AC03-76SF00098
  • Office of Scientific & Technical Information Report Number: 677093
  • Archival Resource Key: ark:/67531/metadc709455

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Office of Scientific & Technical Information Technical Reports

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  • June 1998

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  • Sept. 12, 2015, 6:31 a.m.

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  • April 5, 2016, 12:08 p.m.

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MacDowell, A. A.; Lamble, G. M.; Celestre, R. S.; Padmore, H. A.; Chang, C. H. & Patel, J. R. Progress towards sub-micron hard x-ray imaging using elliptically bent mirrors and its applications, article, June 1998; Berkeley, California. (digital.library.unt.edu/ark:/67531/metadc709455/: accessed November 21, 2018), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.