Interface diffusion in polysynthetically-twinned TiAl

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Description

The utility of polysynthetically-twinned (PST) TiAl, which contains a high density of parallel, atomically-flat interfaces within a set of identical crystallographic orientations, as a potential model system for a detailed investigation of interface diffusion is explored. Macroscopic PST crystals were grown in an optical float zone furnace. Thin films were cut from oriented crystals and polished with <112> directions normal to the film. After sputter cleaning, Ag was deposited on one side of the TiAl thin films. Auger spectra were obtained from these films over a wide range of sputter/anneal conditions. The Al and Ti concentrations were analyzed as well ... continued below

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8 p.

Creation Information

Luzzi, D.E.; Imamura, D.; Inui, H.; Yamaguchi, M.; George, E.P.; Heatherly, L. et al. December 1, 1997.

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Description

The utility of polysynthetically-twinned (PST) TiAl, which contains a high density of parallel, atomically-flat interfaces within a set of identical crystallographic orientations, as a potential model system for a detailed investigation of interface diffusion is explored. Macroscopic PST crystals were grown in an optical float zone furnace. Thin films were cut from oriented crystals and polished with <112> directions normal to the film. After sputter cleaning, Ag was deposited on one side of the TiAl thin films. Auger spectra were obtained from these films over a wide range of sputter/anneal conditions. The Al and Ti concentrations were analyzed as well as the important impurity elements, S, Ar, C, N and O. Using the present data and existing knowledge of the microstructure and crystallography of PSI TiAl, the potential of this material for providing a detailed understanding of the atomistic mechanisms of interface diffusion is analyzed.

Physical Description

8 p.

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OSTI as DE98004898

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  • 1997 fall meeting of the Materials Research Society, Boston, MA (United States), 1-5 Dec 1997

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  • Other: DE98004898
  • Report No.: ORNL/CP--97537
  • Report No.: CONF-971201--
  • Grant Number: AC05-96OR22464
  • DOI: 10.2172/672111 | External Link
  • Office of Scientific & Technical Information Report Number: 672111
  • Archival Resource Key: ark:/67531/metadc708332

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  • December 1, 1997

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  • Sept. 12, 2015, 6:31 a.m.

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  • Nov. 3, 2016, 6:59 p.m.

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Luzzi, D.E.; Imamura, D.; Inui, H.; Yamaguchi, M.; George, E.P.; Heatherly, L. et al. Interface diffusion in polysynthetically-twinned TiAl, report, December 1, 1997; Tennessee. (digital.library.unt.edu/ark:/67531/metadc708332/: accessed December 16, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.