Interfacial electronic charge transfer and density of states in short period Cu/Cr multilayers

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Nanometer period metallic multilayers are ideal structures to investigate electronic phenomena at interfaces between metal films since interfacial atoms comprise a large atomic fraction of the samples. The multilayers studied were fabricated by magnetron sputtering and consist of bilayers from 1.9 mn to 3.3 mn. X-ray diffraction, cross-section TEM and plan-view TEM show the Cu layers to have a BCC structure Cu in contrast to its equilibrium FCC structure. The electronic structure of the Cu and the Cr layers in several samples of thin Cu/Cr multilayers were studied using x-ray absorption spectroscopy (XAS). Total electron yield was measured and used ... continued below

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9 p.

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Bello, A.F.; Van Buuren, T.; Kepesis, J.E. & Barbee, T.W., Jr. April 1, 1998.

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Nanometer period metallic multilayers are ideal structures to investigate electronic phenomena at interfaces between metal films since interfacial atoms comprise a large atomic fraction of the samples. The multilayers studied were fabricated by magnetron sputtering and consist of bilayers from 1.9 mn to 3.3 mn. X-ray diffraction, cross-section TEM and plan-view TEM show the Cu layers to have a BCC structure Cu in contrast to its equilibrium FCC structure. The electronic structure of the Cu and the Cr layers in several samples of thin Cu/Cr multilayers were studied using x-ray absorption spectroscopy (XAS). Total electron yield was measured and used to study the white lines at the Cu L{sub 2} and L{sub 3} absorption edges. The white lines at the Cu absorption edges are strongly related to the unoccupied d-orbitals and are used to calculate the amount of charge transfer between the Cr and Cu atoms in interfaces. Analysis of the Cu white lines show a charge transfer of 0.026 electrons/interfacial Cu atom to the interfacial Cr atoms. In the Cu XAS spectra we also observe a van Hove singularity between the L{sub 2} and L{sub 3} absorption edges as expected from the structural analysis. The absorption spectra are compared to partial density of states obtained from a full-potential linear muffin-tin orbital calculation. The calculations confirm the presence of charge transfer and indicate that it is localized to the first two interfacial layers in both Cu and Cr.

Physical Description

9 p.

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OSTI as DE98057688

Other: FDE: PDF; PL:

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  • Spring meeting of the Materials Research Society, San Francisco, CA (United States), 13-17 Apr 1998

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  • Other: DE98057688
  • Report No.: UCRL-JC--130780
  • Report No.: CONF-980405--
  • Grant Number: W-7405-ENG-48
  • Office of Scientific & Technical Information Report Number: 675088
  • Archival Resource Key: ark:/67531/metadc708298

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  • April 1, 1998

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  • Sept. 12, 2015, 6:31 a.m.

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  • April 6, 2017, 6:17 p.m.

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Bello, A.F.; Van Buuren, T.; Kepesis, J.E. & Barbee, T.W., Jr. Interfacial electronic charge transfer and density of states in short period Cu/Cr multilayers, article, April 1, 1998; California. (digital.library.unt.edu/ark:/67531/metadc708298/: accessed October 17, 2018), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.