Electrical Characterization of Etched Grain-Boundary Properties from As-Processed px-CdTe Based Solar Cells

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An ability to lift off or separate the thin-film polycrystalline CdTe from the CdS, without the use of chemical etches, has enabled direct electrical characterization of the as-processed CdTe near the CdTe/CdS heterointerface. We use this ability to understand how a back-contact, nitric-phosphoric (NP) etch affects the grain boundaries throughout the film. Quantitative determination of the grain-boundary barrier potentials and estimates of doping density near the grain perimeter are determined from theoretical fits to measurements of the current vs. temperature. Estimates of the bulk doping are determined from high-frequency resistivity measurements. Also, a variable doping density within the grains of ... continued below

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Woods, L. M.; Robinson, G. Y. (Colorado State University, Ft. Collins, CO) & Levi, D. H. (National Renewable Energy Laboratory) Kaydanov, V. (Colorado School of Mines, Golden, CO) October 22, 1998.

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An ability to lift off or separate the thin-film polycrystalline CdTe from the CdS, without the use of chemical etches, has enabled direct electrical characterization of the as-processed CdTe near the CdTe/CdS heterointerface. We use this ability to understand how a back-contact, nitric-phosphoric (NP) etch affects the grain boundaries throughout the film. Quantitative determination of the grain-boundary barrier potentials and estimates of doping density near the grain perimeter are determined from theoretical fits to measurements of the current vs. temperature. Estimates of the bulk doping are determined from high-frequency resistivity measurements. Also, a variable doping density within the grains of non-etched material has been determined. These results allow a semi-quantitative grain-boundary band diagram to be drawn that should aid in determining more-accurate two-dimensional models for polycrystalline CdTe solar cells.

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  • Presented at the National Center for Photovoltaics Program Review Meeting, Denver, CO (US), 09/08/1998--09/11/1998

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  • Other: DE00006604
  • Report No.: NREL/CP-520-25632
  • Grant Number: AC36-99GO10337
  • Office of Scientific & Technical Information Report Number: 6604
  • Archival Resource Key: ark:/67531/metadc708264

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  • October 22, 1998

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  • Sept. 12, 2015, 6:31 a.m.

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  • March 28, 2016, 1:35 p.m.

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Woods, L. M.; Robinson, G. Y. (Colorado State University, Ft. Collins, CO) & Levi, D. H. (National Renewable Energy Laboratory) Kaydanov, V. (Colorado School of Mines, Golden, CO). Electrical Characterization of Etched Grain-Boundary Properties from As-Processed px-CdTe Based Solar Cells, article, October 22, 1998; Golden, Colorado. (digital.library.unt.edu/ark:/67531/metadc708264/: accessed October 22, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.