In situ real-time studies of oxygen incorporation in complex oxide thin films using spectroscopic ellipsometry and ion scattering and recoil spectrometry

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The surface termination of c-axis oriented YBa{sub 2}Cu{sub 3}O{sub 7{minus}{delta}} (YBCO) and the oxygen incorporation mechanism has been investigated using a unique combination of spectroscopic ellipsometry (SE) and time of flight ion scattering and recoil spectrometry (ToF-ISARS). The high surface sensitivity of the ToF-ISARS technique combined with the bulk oxygen sensitivity of SE are shown to yield complimentary information. The SE provided the film orientation and quality, while ToF-ISARS supplied surface compositional and structural information and enabled isotopic {sup 18}O tracer studies. It was determined that the O content of the film had little effect on the surface termination of ... continued below

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8 p.

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Mueller, A. H.; Gao, Y.; Irene, E. A.; Auciello, O.; Krauss, A. R. & Achultz, J. A. May 25, 2000.

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Description

The surface termination of c-axis oriented YBa{sub 2}Cu{sub 3}O{sub 7{minus}{delta}} (YBCO) and the oxygen incorporation mechanism has been investigated using a unique combination of spectroscopic ellipsometry (SE) and time of flight ion scattering and recoil spectrometry (ToF-ISARS). The high surface sensitivity of the ToF-ISARS technique combined with the bulk oxygen sensitivity of SE are shown to yield complimentary information. The SE provided the film orientation and quality, while ToF-ISARS supplied surface compositional and structural information and enabled isotopic {sup 18}O tracer studies. It was determined that the O content of the film had little effect on the surface termination of the film, indicating a lack of labile Cu(1) sites at the c-axis oriented YBCO surface. Also, strong evidence for a Ba or BaO terminated structure is shown. The data related to the {sup 18}O tracer studies indicate that O from the reaction ambient incorporates only into the labile Cu(1) sites during both deposition and annealing, while stable O sites were populated with O from the sputtered target, indicating either the need for sputtered atomic O or sputtered YCuO complexes to occupy the stable Cu(2) sites.

Physical Description

8 p.

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INIS; OSTI as DE00755892

Medium: P; Size: 8 pages

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  • 2000 MRS Spring Meeting, San Francisco, CA (US), 04/24/2000--04/28/2000

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  • Report No.: ANL/MSD/CP-101998
  • Grant Number: W-31109-ENG-38
  • Office of Scientific & Technical Information Report Number: 755892
  • Archival Resource Key: ark:/67531/metadc707581

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  • May 25, 2000

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  • Sept. 12, 2015, 6:31 a.m.

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  • April 11, 2017, 6:48 p.m.

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Mueller, A. H.; Gao, Y.; Irene, E. A.; Auciello, O.; Krauss, A. R. & Achultz, J. A. In situ real-time studies of oxygen incorporation in complex oxide thin films using spectroscopic ellipsometry and ion scattering and recoil spectrometry, article, May 25, 2000; Illinois. (digital.library.unt.edu/ark:/67531/metadc707581/: accessed April 22, 2018), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.