Transmission Electron Microscopy Characterization of Nanocrystalline Copper

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The microstructure and grain boundary structure of nanocrystalline Cu powders and a compact prepared by the inert-gas condensation technique have been characterized by transmission electron microscopy. The as-prepared particles are round in shape and have no distinct surface facets. Annealing twins (coherent {Sigma}3 boundaries) have been observed in the as-prepared Cu particles as well as in the compact. Pores are commonly found at grain boundaries, triple grain junctions and some in the interior of grains in the compact. In addition to twin boundaries, a number of special grain boundaries have been observed. These special grain boundaries have low-index interface planes, ... continued below

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Kung, H.; Sanders, P.G. & Weertman, J.R. November 1, 1999.

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The microstructure and grain boundary structure of nanocrystalline Cu powders and a compact prepared by the inert-gas condensation technique have been characterized by transmission electron microscopy. The as-prepared particles are round in shape and have no distinct surface facets. Annealing twins (coherent {Sigma}3 boundaries) have been observed in the as-prepared Cu particles as well as in the compact. Pores are commonly found at grain boundaries, triple grain junctions and some in the interior of grains in the compact. In addition to twin boundaries, a number of special grain boundaries have been observed. These special grain boundaries have low-index interface planes, and sometimes have misorientation angles close to coincidence site lattice (CSL) orientations.

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Medium: P; Size: vp.

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OSTI as DE00758964

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  • Advanced Materials for the 21st Century, Julia R. Weertman Symposium, Cincinnati, OH (US), 11/01/1999--11/05/1999

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  • Report No.: LA-UR-99-3035
  • Grant Number: W-7405-ENG-36
  • Office of Scientific & Technical Information Report Number: 758964
  • Archival Resource Key: ark:/67531/metadc707139

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  • November 1, 1999

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  • Sept. 12, 2015, 6:31 a.m.

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  • March 24, 2016, 3:09 p.m.

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Kung, H.; Sanders, P.G. & Weertman, J.R. Transmission Electron Microscopy Characterization of Nanocrystalline Copper, article, November 1, 1999; New Mexico. (digital.library.unt.edu/ark:/67531/metadc707139/: accessed October 17, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.