Thermal-stress effects are shown to have a significant impact on the enhanced low-dose-rate sensitivity of linear bipolar circuits. Implications of these results on hardness assurance testing and mechanisms are discussed.
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Sandia National Labs., Albuquerque, NM, and Livermore, CA (United States)
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Albuquerque, New Mexico
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Thermal-stress effects are shown to have a significant impact on the enhanced low-dose-rate sensitivity of linear bipolar circuits. Implications of these results on hardness assurance testing and mechanisms are discussed.
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SHANEYFELT,MARTY R.; SCHWANK,JAMES R.; WITCZAK,STEVEN C.; RIEWE,LEONARD CHARLES; WINOKUR,PETER S.; HASH,GERALD L. et al.Thermal-stress effects on enhanced low-dose-rate sensitivity of linear bipolar circuits,
article,
February 17, 2000;
Albuquerque, New Mexico.
(digital.library.unt.edu/ark:/67531/metadc706075/:
accessed April 27, 2018),
University of North Texas Libraries, Digital Library, digital.library.unt.edu;
crediting UNT Libraries Government Documents Department.