Thermal-stress effects on enhanced low-dose-rate sensitivity of linear bipolar circuits

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Thermal-stress effects are shown to have a significant impact on the enhanced low-dose-rate sensitivity of linear bipolar circuits. Implications of these results on hardness assurance testing and mechanisms are discussed.

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5 p.

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SHANEYFELT,MARTY R.; SCHWANK,JAMES R.; WITCZAK,STEVEN C.; RIEWE,LEONARD CHARLES; WINOKUR,PETER S.; HASH,GERALD L. et al. February 17, 2000.

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  • Sandia National Laboratories
    Publisher Info: Sandia National Labs., Albuquerque, NM, and Livermore, CA (United States)
    Place of Publication: Albuquerque, New Mexico

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Description

Thermal-stress effects are shown to have a significant impact on the enhanced low-dose-rate sensitivity of linear bipolar circuits. Implications of these results on hardness assurance testing and mechanisms are discussed.

Physical Description

5 p.

Notes

INIS; OSTI as DE00751354

Medium: P; Size: 5 pages

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  • 2000 IEEE Nuclear and Space Radiation Effects Conference, Reno, NV (US), 07/24/2000--07/28/2000

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  • Report No.: SAND2000-0456C
  • Grant Number: AC04-94AL85000
  • Office of Scientific & Technical Information Report Number: 751354
  • Archival Resource Key: ark:/67531/metadc706075

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Office of Scientific & Technical Information Technical Reports

Reports, articles and other documents harvested from the Office of Scientific and Technical Information.

Office of Scientific and Technical Information (OSTI) is the Department of Energy (DOE) office that collects, preserves, and disseminates DOE-sponsored research and development (R&D) results that are the outcomes of R&D projects or other funded activities at DOE labs and facilities nationwide and grantees at universities and other institutions.

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  • February 17, 2000

Added to The UNT Digital Library

  • Sept. 12, 2015, 6:31 a.m.

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  • April 11, 2017, 12:29 p.m.

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SHANEYFELT,MARTY R.; SCHWANK,JAMES R.; WITCZAK,STEVEN C.; RIEWE,LEONARD CHARLES; WINOKUR,PETER S.; HASH,GERALD L. et al. Thermal-stress effects on enhanced low-dose-rate sensitivity of linear bipolar circuits, article, February 17, 2000; Albuquerque, New Mexico. (digital.library.unt.edu/ark:/67531/metadc706075/: accessed December 13, 2018), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.