Optical properties of Cd{sub 0.9}Zn{sub 0.1}Te studied by variable angle spectroscopic ellipsometry between 0.75 and 6.24 eV

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Optical properties of Cd{sub 0.9}Zn{sub 0.1}Te (CZT) were studied by variable angle spectroscopic ellipsometry (VASE). Measurements made by VASE were performed on CZT and CdTe samples in air at room temperature at multiple angles of incidence. A parametric function model was employed in the VASE analysis to determine the dielectric functions {var_epsilon}={var_epsilon}{sub 1} + i{var_epsilon}{sub 2} in the range of 0.75 to 6.24 eV. A two-oscillator analytical model was used to describe the dielectric response of native oxides on CZT. Surface oxide optical properties and thickness on CZT were also determined in conjunction with the VASE measurement and analysis of ... continued below

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23 p.

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James, Ralph B. January 7, 2000.

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This article is part of the collection entitled: Office of Scientific & Technical Information Technical Reports and was provided by UNT Libraries Government Documents Department to Digital Library, a digital repository hosted by the UNT Libraries. It has been viewed 13 times . More information about this article can be viewed below.

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  • Sandia National Laboratories
    Publisher Info: Sandia National Labs., Albuquerque, NM, and Livermore, CA (United States)
    Place of Publication: Albuquerque, New Mexico

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Optical properties of Cd{sub 0.9}Zn{sub 0.1}Te (CZT) were studied by variable angle spectroscopic ellipsometry (VASE). Measurements made by VASE were performed on CZT and CdTe samples in air at room temperature at multiple angles of incidence. A parametric function model was employed in the VASE analysis to determine the dielectric functions {var_epsilon}={var_epsilon}{sub 1} + i{var_epsilon}{sub 2} in the range of 0.75 to 6.24 eV. A two-oscillator analytical model was used to describe the dielectric response of native oxides on CZT. Surface oxide optical properties and thickness on CZT were also determined in conjunction with the VASE measurement and analysis of a CdTe sample. Two samples of CZT of different oxide thicknesses were measured and their optical constants were coupled together in a multiple-sample, multiple-model VASE analysis to resolve correlations between fitting parameters. Effective medium approximation (EMA) was used to describe the optical properties of the CZT oxide with roughness. A Kramers-Kronig self-consistency check of the real and imaginary parts of the Cd{sub 0.9}Zn{sub 0.1} dielectric functions was performed over the energy range 0.75 to 6.24 eV. A five-Lorentz-oscillator model was employed to describe the dielectric response of CZT in the range of 1.6 to 6.24 eV. Intensity transmission measurements were made on the Cd{sub 0.9}Zn{sub 0.1}Te and CdTe, showing the absorption energy band edges of {approximately} 1.58 and 1.46 eV, respectively.

Physical Description

23 p.

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INIS; OSTI as DE00755814

Medium: P; Size: 23 pages

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  • 1998 Workshop on the Physics and Chemistry of II-VI Semiconductors, Charleston, SC (US), 10/20/1998

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  • Report No.: SAND2000-8524C
  • Grant Number: AC04-94AL85000
  • Office of Scientific & Technical Information Report Number: 755814
  • Archival Resource Key: ark:/67531/metadc705812

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  • January 7, 2000

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  • Sept. 12, 2015, 6:31 a.m.

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  • April 10, 2017, 3:57 p.m.

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James, Ralph B. Optical properties of Cd{sub 0.9}Zn{sub 0.1}Te studied by variable angle spectroscopic ellipsometry between 0.75 and 6.24 eV, article, January 7, 2000; Albuquerque, New Mexico. (digital.library.unt.edu/ark:/67531/metadc705812/: accessed September 20, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.