X-ray Raman scattering in H-BN observed by soft x-ray fluorescence spectroscopy Metadata

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Title

  • Main Title X-ray Raman scattering in H-BN observed by soft x-ray fluorescence spectroscopy

Creator

  • Author: Jia, J.J.
    Creator Type: Personal
  • Author: Callcott, T.A.
    Creator Type: Personal
    Creator Info: Tennessee Univ., Knoxville, TN (United States)
  • Author: Carlisle, J.A.
    Creator Type: Personal
  • Author: Terminello, L.J.
    Creator Type: Personal
  • Author: Asfaw, A.
    Creator Type: Personal
    Creator Info: Lawrence Livermore National Lab., CA (United States)
  • Author: Ederer, D.L.
    Creator Type: Personal
    Creator Info: Tulane Univ., New Orleans, LA (United States)
  • Author: Himpsel, F.J.
    Creator Type: Personal
    Creator Info: International Business Machines Corp., Yorktown Heights, NY (United States). Thomas J. Watson Research Center
  • Author: Perera, R.C.C.
    Creator Type: Personal
    Creator Info: Lawrence Berkeley Lab., CA (United States)

Contributor

  • Sponsor: United States. Department of Energy.
    Contributor Type: Organization
    Contributor Info: USDOE, Washington, DC (United States)
  • Sponsor: National Science Foundation (U.S.)
    Contributor Type: Organization
    Contributor Info: National Science Foundation, Washington, DC (United States)

Publisher

  • Name: Lawrence Berkeley National Laboratory
    Place of Publication: California
    Additional Info: Lawrence Berkeley Lab., CA (United States)

Date

  • Creation: 1995-03-01

Language

  • English

Description

  • Content Description: Raman scattering of soft x-rays is observed in h-BN using monochromatic soft x-rays just below the B K absorption edge. The inelastic features are visible below threshold, track with the excitation energy, go through a resonance as the excitation is tuned to the B ls core exciton energy, and finally evolve into normal fluorescence as the excitation is raised above the energy needed to excite the B ls electron into the conduction band. The inelastic energy loss is identified as an excitation of valence {sigma} electrons into the {pi}* valence exciton state; at resonance and above, {pi} {minus} {pi}* transitions are also observed. At resonance, a sideband on the elastic peak Ls observed, which gives evidence of additional electronic and phonon loss processes. Very similar results have also been observed for B{sub 2}O{sub 3}.
  • Physical Description: 15 p.

Subject

  • Keyword: X-Ray Diffraction
  • Keyword: Raman Effect
  • Keyword: Fluorescence Spectroscopy
  • Keyword: X-Ray Fluorescence Analysis
  • STI Subject Categories: 66 Physics
  • Keyword: X-Ray Spectra
  • Keyword: Boron Oxides
  • Keyword: Scattering

Source

  • Other Information: PBD: Mar 1995

Collection

  • Name: Office of Scientific & Technical Information Technical Reports
    Code: OSTI

Institution

  • Name: UNT Libraries Government Documents Department
    Code: UNTGD

Resource Type

  • Report

Format

  • Text

Identifier

  • Other: DE95012360
  • Report No.: LBL--36923
  • Grant Number: AC03-76SF00098
  • DOI: 10.2172/70794
  • Office of Scientific & Technical Information Report Number: 70794
  • Archival Resource Key: ark:/67531/metadc704330

Note

  • Display Note: OSTI as DE95012360