Full image spectral analysis of elemental emissions from an echelle spectrograph

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A new algorithm compares the background corrected echelle emission image obtained from reference standards to images of unknowns for quantitative elemental analyses. Wavelength was not used in the calculations but instead pixel position and intensity. The data reduction solution was unique to the particular detector/spectrometer. The approach was found useful for several types of images including ICP, DCP and glow discharge images. The analysis scheme required that the emission pattern of standards and background be held in memory. A dual weighting scheme was used that decreased the importance of pixels in high background areas and enhanced the importance of signals ... continued below

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Spencer, W.A. January 27, 2000.

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A new algorithm compares the background corrected echelle emission image obtained from reference standards to images of unknowns for quantitative elemental analyses. Wavelength was not used in the calculations but instead pixel position and intensity. The data reduction solution was unique to the particular detector/spectrometer. The approach was found useful for several types of images including ICP, DCP and glow discharge images. The analysis scheme required that the emission pattern of standards and background be held in memory. A dual weighting scheme was used that decreased the importance of pixels in high background areas and enhanced the importance of signals from pixels where the standards had emissions. Threshold values were used to limit the calculations to signals in the linear range of the electronics. Logarithmic weighting, (by taking the square root), was found to work well for weighting pixels from the standards. This assured that minor emissions had some influence on the data fit. In the program the best-fit scalar was determined using simple iterative guess, change and test approaches. The test looked for the minimum least square residual value in the areas of the flagged pixels.

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  • 2000 Winter Conference of Plasma, Fort Lauderdale, FL (US), 01/10/2000--01/15/2000

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  • Report No.: WSRC-MS--99-00516/Rev.2
  • Grant Number: AC09-96SR18500
  • Office of Scientific & Technical Information Report Number: 750903
  • Archival Resource Key: ark:/67531/metadc703871

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Office of Scientific & Technical Information Technical Reports

Reports, articles and other documents harvested from the Office of Scientific and Technical Information.

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  • January 27, 2000

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  • Sept. 12, 2015, 6:31 a.m.

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  • May 5, 2016, 1:55 p.m.

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Spencer, W.A. Full image spectral analysis of elemental emissions from an echelle spectrograph, article, January 27, 2000; South Carolina. (digital.library.unt.edu/ark:/67531/metadc703871/: accessed June 25, 2018), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.