New experimental and analysis methods in I-DLTS

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Description

A new experimental apparatus to perform I-DLTS measurements is presented. The method is shown to be faster and more sensitive than traditional double boxcar I-DLTS systems. A novel analysis technique utilizing multiple exponential fits to the I-DLTS signal from a highly neutron irradiated silicon sample is presented with a discussion of the results. It is shown that the new method has better resolution and can deconvolute overlapping peaks more accurately than previous methods.

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13 p.

Creation Information

Pandey, S.U.; Middelkamp, P.; Li, Z. & Eremin, V. February 1, 1998.

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Description

A new experimental apparatus to perform I-DLTS measurements is presented. The method is shown to be faster and more sensitive than traditional double boxcar I-DLTS systems. A novel analysis technique utilizing multiple exponential fits to the I-DLTS signal from a highly neutron irradiated silicon sample is presented with a discussion of the results. It is shown that the new method has better resolution and can deconvolute overlapping peaks more accurately than previous methods.

Physical Description

13 p.

Notes

INIS; OSTI as DE98004440

Source

  • 2. international conference on radiation effects on semiconductor materials, detectors and devices, Florence (Italy), 4-6 Mar 1998

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  • Other: DE98004440
  • Report No.: BNL--65290
  • Report No.: CONF-980355--
  • Grant Number: AC02-76CH00016
  • Office of Scientific & Technical Information Report Number: 654111
  • Archival Resource Key: ark:/67531/metadc703104

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  • February 1, 1998

Added to The UNT Digital Library

  • Sept. 12, 2015, 6:31 a.m.

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  • Nov. 9, 2015, 8:12 p.m.

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Pandey, S.U.; Middelkamp, P.; Li, Z. & Eremin, V. New experimental and analysis methods in I-DLTS, article, February 1, 1998; Upton, New York. (digital.library.unt.edu/ark:/67531/metadc703104/: accessed September 22, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.