Direct-scanning alpha spectrometer for americium and plutonium contamination on highly-enriched uranium surfaces

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Trace Pu{sup 239} and Am{sup 241} contamination on a surface whose alpha count is dominated by U{sup 235} and U{sup 234} decay has been successfully quantified by counting swipes in external alpha spectroscopy chambers. The swipe process, however, is labor intensive and subject to uncertainties in the swiping process as well as degraded spectral resolution due to the presence of the swipe material. A multichannel instrument for automated in situ measurements of interior and exterior contamination has been developed which incorporates a rotary table, 13 fixed ion-implanted silicon detectors, and spectroscopy electronics. Custom software was written to allow alpha spectrometer ... continued below

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15 p.

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Ward, W.C.; Martinez, H.E.; Abeyta, C.L.; Morgan, A.N. & Nelson, T.O. April 2, 1997.

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Description

Trace Pu{sup 239} and Am{sup 241} contamination on a surface whose alpha count is dominated by U{sup 235} and U{sup 234} decay has been successfully quantified by counting swipes in external alpha spectroscopy chambers. The swipe process, however, is labor intensive and subject to uncertainties in the swiping process as well as degraded spectral resolution due to the presence of the swipe material. A multichannel instrument for automated in situ measurements of interior and exterior contamination has been developed which incorporates a rotary table, 13 fixed ion-implanted silicon detectors, and spectroscopy electronics. Custom software was written to allow alpha spectrometer to function as a virtual instrument in the LabView environment. This system gives improved speed and resolution as well as a complete log of the location of areas of high surface contamination, a feature not practical to obtain by other methods, and one which opens the possibility of long term studies such as Pu outgrowth evaluation employing the instrument. The authors present performance data as well as system integration, calibration, control, and dynamic geometric efficiency calculations related to the design of this and next generation systems.

Physical Description

15 p.

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INIS; OSTI as DE97007171

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  • 4. international conference on methods and applications of radioanalytical chemistry, Kona, HI (United States), 6-11 Apr 1997

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  • Other: DE97007171
  • Report No.: LA-UR--97-1197
  • Report No.: CONF-970424--14
  • Grant Number: W-7405-ENG-36
  • Office of Scientific & Technical Information Report Number: 510317
  • Archival Resource Key: ark:/67531/metadc699219

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  • April 2, 1997

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  • Aug. 14, 2015, 8:43 a.m.

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  • Feb. 25, 2016, 4:03 p.m.

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Ward, W.C.; Martinez, H.E.; Abeyta, C.L.; Morgan, A.N. & Nelson, T.O. Direct-scanning alpha spectrometer for americium and plutonium contamination on highly-enriched uranium surfaces, article, April 2, 1997; New Mexico. (digital.library.unt.edu/ark:/67531/metadc699219/: accessed August 21, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.