Particle trapping with an rf cavity

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Description

It is in principle possible to trap charged particles in an rf cavity. In this note the authors calculate the trapping mechanism of the field pattern given by (1). The trapping occurs for either sign of the charge of the particles. The mode pattern (1) traps particles around the node point (0,0,0). Such a trapping mechanism is of course considered favorable for a particle trap. On the other hand, it may also happen that undesirable stray particles are trapped at nodes of an rf device, which then perturbs the normal operation of an accelerator. Such trappings are then undesirable and ... continued below

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7 p.

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Chao, A. November 1, 1995.

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Description

It is in principle possible to trap charged particles in an rf cavity. In this note the authors calculate the trapping mechanism of the field pattern given by (1). The trapping occurs for either sign of the charge of the particles. The mode pattern (1) traps particles around the node point (0,0,0). Such a trapping mechanism is of course considered favorable for a particle trap. On the other hand, it may also happen that undesirable stray particles are trapped at nodes of an rf device, which then perturbs the normal operation of an accelerator. Such trappings are then undesirable and are to be avoided.

Physical Description

7 p.

Notes

INIS; OSTI as DE97008416

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  • 31. eloisatron workshop on crystalline beams and related issues, Erice (Italy), 11-21 Nov 1995

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  • Other: DE97008416
  • Report No.: SLAC-PUB--7072
  • Report No.: CONF-9511174--5
  • Grant Number: AC03-76SF00515
  • Office of Scientific & Technical Information Report Number: 515623
  • Archival Resource Key: ark:/67531/metadc698789

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  • November 1, 1995

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  • Aug. 14, 2015, 8:43 a.m.

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  • Feb. 5, 2016, 7:37 p.m.

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Chao, A. Particle trapping with an rf cavity, article, November 1, 1995; Menlo Park, California. (digital.library.unt.edu/ark:/67531/metadc698789/: accessed August 21, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.