A comparison of three different ray trace programs for x-ray and infrared synchrotron beamline designs

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There are a number of ray trace programs currently used for the design of synchrotron beamlines. While several of these programs have been written and used mostly within the programmer`s institution, many have also been available to the general public. This paper discusses three such programs. One is a commercial product oriented for the general optical designer (not specifically for synchrotron beamlines). One is designed for synchrotron beamlines and is free with restricted availability. Finally, one is designed for synchrotron beamlines and is used primarily in one institution. The wealth of information from general optical materials and components catalogs is ... continued below

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13 p.

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Irick, S.C. & Jung, C.R. July 1, 1997.

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  • Irick, S.C. Lawrence Berkeley National Lab., CA (United States)
  • Jung, C.R. Berliner Elektronenspeicherring-Gellsellschaft Fuer Synchrotronstrahlung, Berlin (Germany)

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Description

There are a number of ray trace programs currently used for the design of synchrotron beamlines. While several of these programs have been written and used mostly within the programmer`s institution, many have also been available to the general public. This paper discusses three such programs. One is a commercial product oriented for the general optical designer (not specifically for synchrotron beamlines). One is designed for synchrotron beamlines and is free with restricted availability. Finally, one is designed for synchrotron beamlines and is used primarily in one institution. The wealth of information from general optical materials and components catalogs is readily available in the commercial program for general optical designs. This makes the design of an infrared beamline easier from the standpoint of component selection. However, this program is not easily configured for synchrotron beamline designs, particularly for a bending magnet source. The synchrotron ray trace programs offer a variety of sources, but generally are not as easy to use from the standpoint of the user interface. This paper shows ray traces of the same beamline Optikwerks, SHADOW, and RAY, and compares the results.

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13 p.

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INIS; OSTI as DE97054556

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  • Annual meeting of the Society of Photo-Optical Instrumentation Engineers, San Diego, CA (United States), 27 Jul - 1 Aug 1997

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  • Other: DE97054556
  • Report No.: LBNL--40637
  • Report No.: CONF-970706--;LSBL--401
  • Grant Number: AC03-76SF00098
  • Office of Scientific & Technical Information Report Number: 554164
  • Archival Resource Key: ark:/67531/metadc695617

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Office of Scientific & Technical Information Technical Reports

Reports, articles and other documents harvested from the Office of Scientific and Technical Information.

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  • July 1, 1997

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  • Aug. 14, 2015, 8:43 a.m.

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  • April 4, 2016, 9:09 p.m.

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Irick, S.C. & Jung, C.R. A comparison of three different ray trace programs for x-ray and infrared synchrotron beamline designs, article, July 1, 1997; California. (digital.library.unt.edu/ark:/67531/metadc695617/: accessed October 22, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.