Quantification of interfacial segregation by atom probe field ion microscopy

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In boron doped NiAl, the field ion image provides a good indication of grain boundary segregation due to the brightly-imaging nature of the boron atoms. The distribution of these atoms indicates that the coverage varied along the grain boundary.

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3 p.

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Miller, M.K. April 1, 1997.

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Description

In boron doped NiAl, the field ion image provides a good indication of grain boundary segregation due to the brightly-imaging nature of the boron atoms. The distribution of these atoms indicates that the coverage varied along the grain boundary.

Physical Description

3 p.

Notes

OSTI as DE97004717

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  • Microscopy and Microanalysis `97, Cleveland, OH (United States), 10-14 Aug 1997

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  • Other: DE97004717
  • Report No.: CONF-970834--2
  • Grant Number: AC05-96OR22464
  • Office of Scientific & Technical Information Report Number: 501566
  • Archival Resource Key: ark:/67531/metadc695094

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Office of Scientific & Technical Information Technical Reports

Reports, articles and other documents harvested from the Office of Scientific and Technical Information.

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  • April 1, 1997

Added to The UNT Digital Library

  • Aug. 14, 2015, 8:43 a.m.

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  • Jan. 20, 2016, 3:28 p.m.

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Miller, M.K. Quantification of interfacial segregation by atom probe field ion microscopy, article, April 1, 1997; Tennessee. (digital.library.unt.edu/ark:/67531/metadc695094/: accessed October 18, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.