FTIR and FT-PL Spectroscopic Analysis of TPV Materials and Devices

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Impurities in cadmium sulfide (CdS) films are a concern in the fabrication of copper (indium, gallium) diselenide (CIGS) and cadmium telluride (CdTe) photovoltaic devices. Devices incorporating chemical-bath-deposited (CBD) CdS are comparable in quality to devices incorporating purer CdS films grown using vacuum deposition techniques, despite the higher impurity concentrations typically observed in the CBD CdS films. In this paper, we summarize and review the results of Fourier transform infrared (FTIR), Auger, electron microprobe, and X-ray photoelectron spectroscopic (XPS) analyses of the impurities in CBD CdS films. We show that these impurities differ as a function of substrate type and film ... continued below

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Webb, J. D.; Gedvilas, L. M.; Olson, M. R.; Wu, X.; Duda, A.; Wanlass, M. W. et al. October 28, 1998.

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Impurities in cadmium sulfide (CdS) films are a concern in the fabrication of copper (indium, gallium) diselenide (CIGS) and cadmium telluride (CdTe) photovoltaic devices. Devices incorporating chemical-bath-deposited (CBD) CdS are comparable in quality to devices incorporating purer CdS films grown using vacuum deposition techniques, despite the higher impurity concentrations typically observed in the CBD CdS films. In this paper, we summarize and review the results of Fourier transform infrared (FTIR), Auger, electron microprobe, and X-ray photoelectron spectroscopic (XPS) analyses of the impurities in CBD CdS films. We show that these impurities differ as a function of substrate type and film deposition conditions. We also show that some of these impurities exist as 102 micron-scale precipitates.

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OSTI as DE00005040

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  • FTIR and FT-PL Spectroscopic Analysis of TPV Materials and Devices, Presented at the 4th Conference on Thermophotovoltaic Generation of Electricity, Denver, CO (US), 10/11/1998--10/14/1998

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  • Other: DE00005040
  • Report No.: NREL/CP-520-25347
  • Grant Number: AC36-83CH10093
  • Office of Scientific & Technical Information Report Number: 5040
  • Archival Resource Key: ark:/67531/metadc692975

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  • October 28, 1998

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  • Aug. 14, 2015, 8:43 a.m.

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  • March 31, 2016, 2:48 p.m.

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Webb, J. D.; Gedvilas, L. M.; Olson, M. R.; Wu, X.; Duda, A.; Wanlass, M. W. et al. FTIR and FT-PL Spectroscopic Analysis of TPV Materials and Devices, article, October 28, 1998; Golden, Colorado. (digital.library.unt.edu/ark:/67531/metadc692975/: accessed September 23, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.