Attenuated total reflection of dielectric/metal interfaces

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An experimental system for the characterization of metal/dielectric interfaces has been developed. Attenuated Total Reflection (ATR) spectroscopy of a dielectric on a thin metal film, deposited on a multiple reflection ATR element, yields information about the bonding, or lack thereof, at the metal/dielectric interface. At a certain metal thickness, the absorbance due to molecules at the interface, relative to the signal from the bulk dielectric, is at a maximum. A model which uses the Fresnel equations in matrix form, has been used to predict the best metal thickness for each dielectric/metal/ATR element system. The ATR element may be placed in ... continued below

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6 p.

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Clemen, L.L.; Strunk, M.R.; Niemczyk, T.M. & Haaland, D.M. August 1, 1997.

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This article is part of the collection entitled: Office of Scientific & Technical Information Technical Reports and was provided by UNT Libraries Government Documents Department to Digital Library, a digital repository hosted by the UNT Libraries. It has been viewed 69 times , with 4 in the last month . More information about this article can be viewed below.

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  • Sandia National Laboratories
    Publisher Info: Sandia National Labs., Albuquerque, NM (United States)
    Place of Publication: Albuquerque, New Mexico

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Description

An experimental system for the characterization of metal/dielectric interfaces has been developed. Attenuated Total Reflection (ATR) spectroscopy of a dielectric on a thin metal film, deposited on a multiple reflection ATR element, yields information about the bonding, or lack thereof, at the metal/dielectric interface. At a certain metal thickness, the absorbance due to molecules at the interface, relative to the signal from the bulk dielectric, is at a maximum. A model which uses the Fresnel equations in matrix form, has been used to predict the best metal thickness for each dielectric/metal/ATR element system. The ATR element may be placed in an environmental chamber in which the temperature, humidity etc. can be varied, in order to test the integrity of the interface to hostile environments. Chemometric analysis of the IR spectral data maximizes our ability to measure small changes in the interface properties. Preliminary results from polyimide/metal samples are presented.

Physical Description

6 p.

Notes

OSTI as DE98002591

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  • 11. international conference on Fourier transform spectroscopy, Athens, GA (United States), 10-15 Aug 1997

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  • Other: DE98002591
  • Report No.: SAND--98-0068C
  • Report No.: CONF-970812--
  • Grant Number: AC04-94AL85000
  • Office of Scientific & Technical Information Report Number: 636041
  • Archival Resource Key: ark:/67531/metadc692682

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Office of Scientific & Technical Information Technical Reports

Reports, articles and other documents harvested from the Office of Scientific and Technical Information.

Office of Scientific and Technical Information (OSTI) is the Department of Energy (DOE) office that collects, preserves, and disseminates DOE-sponsored research and development (R&D) results that are the outcomes of R&D projects or other funded activities at DOE labs and facilities nationwide and grantees at universities and other institutions.

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  • August 1, 1997

Added to The UNT Digital Library

  • Aug. 14, 2015, 8:43 a.m.

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  • May 5, 2016, 7:57 p.m.

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Clemen, L.L.; Strunk, M.R.; Niemczyk, T.M. & Haaland, D.M. Attenuated total reflection of dielectric/metal interfaces, article, August 1, 1997; Albuquerque, New Mexico. (digital.library.unt.edu/ark:/67531/metadc692682/: accessed November 17, 2018), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.