Relevant ion time scales for electron impact processes of atoms in dense plasmas

PDF Version Also Available for Download.

Description

In this paper a new model for treating collisional atomic processes has been presented. This model simultaneously and self-consistently treats electron and ion processes. For transitions frequencies above the ion plasma frequency, it is argued that little ion motion occurs although the interaction is still strong; the ion microfield perturbs the atom. The electron impact processes may still be described by a DSF between levels of the perturbed atoms, suggesting the name Microfield Stochastic Model (MSM) for this method. Future work will be directed towards refining some of the approximations used here for application to realistic systems.

Physical Description

9 p.

Creation Information

Murillo, M.S. December 31, 1997.

Context

This article is part of the collection entitled: Office of Scientific & Technical Information Technical Reports and was provided by UNT Libraries Government Documents Department to Digital Library, a digital repository hosted by the UNT Libraries. More information about this article can be viewed below.

Who

People and organizations associated with either the creation of this article or its content.

Author

  • Murillo, M.S. Los Alamos National Lab., NM (United States). Applied Theoretical Div.

Sponsor

Publisher

Provided By

UNT Libraries Government Documents Department

Serving as both a federal and a state depository library, the UNT Libraries Government Documents Department maintains millions of items in a variety of formats. The department is a member of the FDLP Content Partnerships Program and an Affiliated Archive of the National Archives.

Contact Us

What

Descriptive information to help identify this article. Follow the links below to find similar items on the Digital Library.

Description

In this paper a new model for treating collisional atomic processes has been presented. This model simultaneously and self-consistently treats electron and ion processes. For transitions frequencies above the ion plasma frequency, it is argued that little ion motion occurs although the interaction is still strong; the ion microfield perturbs the atom. The electron impact processes may still be described by a DSF between levels of the perturbed atoms, suggesting the name Microfield Stochastic Model (MSM) for this method. Future work will be directed towards refining some of the approximations used here for application to realistic systems.

Physical Description

9 p.

Notes

INIS; OSTI as DE98001601

Source

  • International conference on strongly coupled coulomb systems, Boston, MA (United States), 3-10 Aug 1997

Language

Item Type

Identifier

Unique identifying numbers for this article in the Digital Library or other systems.

  • Other: DE98001601
  • Report No.: LA-UR--97-3978
  • Report No.: CONF-9708136--
  • Grant Number: W-7405-ENG-36
  • Office of Scientific & Technical Information Report Number: 563301
  • Archival Resource Key: ark:/67531/metadc691913

Collections

This article is part of the following collection of related materials.

Office of Scientific & Technical Information Technical Reports

Reports, articles and other documents harvested from the Office of Scientific and Technical Information.

Office of Scientific and Technical Information (OSTI) is the Department of Energy (DOE) office that collects, preserves, and disseminates DOE-sponsored research and development (R&D) results that are the outcomes of R&D projects or other funded activities at DOE labs and facilities nationwide and grantees at universities and other institutions.

What responsibilities do I have when using this article?

When

Dates and time periods associated with this article.

Creation Date

  • December 31, 1997

Added to The UNT Digital Library

  • Aug. 14, 2015, 8:43 a.m.

Description Last Updated

  • Feb. 26, 2016, 4:05 p.m.

Usage Statistics

When was this article last used?

Yesterday: 0
Past 30 days: 0
Total Uses: 2

Interact With This Article

Here are some suggestions for what to do next.

Start Reading

PDF Version Also Available for Download.

International Image Interoperability Framework

IIF Logo

We support the IIIF Presentation API

Murillo, M.S. Relevant ion time scales for electron impact processes of atoms in dense plasmas, article, December 31, 1997; New Mexico. (digital.library.unt.edu/ark:/67531/metadc691913/: accessed November 21, 2018), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.